Assignee
NIDEC READ CORP
JP·65 granted patents·19 pending applications·325 citations·filing 1997–2023
Top patents by PatentIndex Score
84 records- 0189US10914758B2Inspection jig provided with probe, substrate inspection device provided with same, and method for manufacturing inspection jigNIDEC READ CORP·Filed 2017·Granted Feb 9, 2021·4 cites·9 claims
- 0289US10649005B2Contact terminal, inspection jig, and inspection deviceNIDEC READ CORP·Filed 2017·Granted May 12, 2020·4 cites·20 claims
- 0385US12092662B2Clamp-type AC voltage probeNIDEC READ CORP·Filed 2021·Granted Sep 17, 2024·1 cites·20 claims
- 0485US10649004B2Contact terminal, inspection jig, and inspection apparatusNIDEC READ CORP·Filed 2018·Granted May 12, 2020·3 cites·18 claims
- 0584US11830670B2Coiled electronic componentNIDEC READ CORP·Filed 2022·Granted Nov 28, 2023·0 cites·6 claims
- 0683US6097202ACircuit board inspection apparatus and methodNIDEC READ CORP·Filed 1998·Granted Aug 1, 2000·53 cites·22 claims
- 0782US6411079B1Printed circuit board testing apparatus with dedicated test head and versatile-use test headNIDEC READ CORP·Filed 2000·Granted Jun 25, 2002·26 cites·10 claims
- 0880US6459272B1Apparatus and method for inspecting wiring on boardNIDEC READ CORP·Filed 2000·Granted Oct 1, 2002·28 cites·30 claims
- 0979US6486689B1Printed circuit board testing apparatus and probe device for use in the sameNIDEC READ CORP·Filed 2000·Granted Nov 26, 2002·23 cites·6 claims
- 1075US6777949B2Circuit board testing apparatus and method for testing a circuit boardNIDEC READ CORP·Filed 2002·Granted Aug 17, 2004·18 cites·37 claims
- 1174US10656179B2Contact terminal, inspection jig, and inspection deviceNIDEC READ CORP·Filed 2017·Granted May 19, 2020·1 cites·20 claims
- 1273US10877085B2Inspection jig and inspection deviceNIDEC READ CORP·Filed 2017·Granted Dec 29, 2020·2 cites·13 claims
- 1372US5969530ACircuit board inspection apparatus and method employing a rapidly changing electrical parameter signalNIDEC READ CORP·Filed 1998·Granted Oct 19, 1999·36 cites·23 claims
- 1470US7202690B2Substrate inspection device and substrate inspecting methodNIDEC READ CORP·Filed 2005·Granted Apr 10, 2007·6 cites·21 claims
- 1569US11953314B2Imaging device, bump inspection device, and imaging methodNIDEC READ CORP·Filed 2023·Granted Apr 9, 2024·0 cites·6 claims
- 1669US10962569B2Probe, inspection jig, inspection device, and method of manufacturing probeNIDEC READ CORP·Filed 2019·Granted Mar 30, 2021·1 cites·20 claims
- 1769US6462556B2Circuit board testing apparatus and methodNIDEC READ CORP·Filed 2001·Granted Oct 8, 2002·17 cites·16 claims
- 1868US11527341B2Coiled electronic component, coil component, manufacturing method of coil component, inductance element, T-type filter, oscillation circuit, and manufacturing method of inductanceNIDEC READ CORP·Filed 2018·Granted Dec 13, 2022·0 cites·9 claims
- 1968US10782317B2Contact probeNIDEC READ CORP·Filed 2018·Granted Sep 22, 2020·0 cites·20 claims
- 2068US9606166B2Insulation inspection apparatus and insulation inspection methodNIDEC-READ CORP·Filed 2014·Granted Mar 28, 2017·2 cites·5 claims
- 2167US11009523B2Probe, inspection jig, and inspection apparatusNIDEC READ CORP·Filed 2019·Granted May 18, 2021·1 cites·20 claims
- 2264US11408915B2Cylindrical body and method for producing sameNIDEC READ CORP·Filed 2019·Granted Aug 9, 2022·0 cites·8 claims
- 2363US11953562B2MI sensor and method for manufacturing MI sensorNIDEC READ CORP·Filed 2019·Granted Apr 9, 2024·0 cites·9 claims
- 2463US6316949B1Apparatus and method for testing electric conductivity of circuit path ways on circuit boardNIDEC READ CORP·Filed 2000·Granted Nov 13, 2001·12 cites·24 claims
- 2562US9678134B2Method for determining maintenance time for contacts, and testing apparatusNIDEC-READ CORP·Filed 2014·Granted Jun 13, 2017·1 cites·3 claims
- 2661US9910084B2Flexible circuit board inspecting apparatusNIDEC READ CORP·Filed 2015·Granted Mar 6, 2018·1 cites·20 claims
- 2761US9733299B2Inspection jigNIDEC-READ CORP·Filed 2014·Granted Aug 15, 2017·2 cites·20 claims
- 2861US6356093B2Printed circuit board testing apparatusNIDEC READ CORP·Filed 1999·Granted Mar 12, 2002·29 cites·15 claims
- 2960US11933837B2Inspection jig, and inspection deviceNIDEC READ CORP·Filed 2020·Granted Mar 19, 2024·0 cites·20 claims
- 3060US11415599B2Contact probe and electrical connection jigNIDEC READ CORP·Filed 2017·Granted Aug 16, 2022·0 cites·20 claims
- 3159US12072352B2Inspection jig and inspection deviceNIDEC READ CORP·Filed 2020·Granted Aug 27, 2024·0 cites·20 claims
- 3256US2020257388A1Inspecting apparatusNIDEC-READ CORP·Filed 2020·Application pending·0 cites
- 3354US11454650B2Probe, inspection jig, inspection device, and method for manufacturing probeNIDEC READ CORP·Filed 2019·Granted Sep 27, 2022·0 cites·18 claims
- 3454US7112967B2Circuit based testing apparatus and method for testing a circuit boardNIDEC READ CORP·Filed 2004·Granted Sep 26, 2006·6 cites·19 claims
- 3553US12135336B2Contact, inspection jig, inspection device, and method of manufacturing contactNIDEC READ CORP·Filed 2020·Granted Nov 5, 2024·0 cites·19 claims
- 3653US12131460B2Image processing apparatus, image processing method, and inspection apparatusNIDEC READ CORP·Filed 2022·Granted Oct 29, 2024·0 cites·19 claims
- 3753US6353327B2Circuit board misalignment detection apparatus and methodNIDEC READ CORP·Filed 1998·Granted Mar 5, 2002·17 cites·8 claims
- 3852US12158480B2Inspection jig and inspection deviceNIDEC READ CORP·Filed 2021·Granted Dec 3, 2024·0 cites·20 claims
- 3952US12055561B2Contact terminal, inspection jig, and inspection deviceNIDEC READ CORP·Filed 2020·Granted Aug 6, 2024·0 cites·20 claims
- 4052US10678385B2Inspecting apparatusNIDEC READ CORP·Filed 2017·Granted Jun 9, 2020·0 cites·5 claims
- 4151US12055579B2Inspection jig and circuit board inspection apparatus including the sameNIDEC READ CORP·Filed 2021·Granted Aug 6, 2024·0 cites·19 claims
- 4251US12055562B2Contact terminal, inspection jig, and inspection apparatusNIDEC READ CORP·Filed 2021·Granted Aug 6, 2024·0 cites·20 claims
- 4351US11940482B2Inspection deviceNIDEC READ CORP·Filed 2020·Granted Mar 26, 2024·0 cites·11 claims
- 4451US2015086303A1Processing object transport system, and substrate inspection systemNIDEC READ CORP·Filed 2014·Application pending·0 cites
- 4550US12055580B2Circuit board inspecting apparatusNIDEC READ CORP·Filed 2021·Granted Aug 6, 2024·0 cites·12 claims
- 4650US11977100B2Inspection jigNIDEC READ CORP·Filed 2020·Granted May 7, 2024·0 cites·20 claims
- 4749US12055615B2Detection value correction system, coefficient calculation method, and detection value correction methodNIDEC READ CORP·Filed 2020·Granted Aug 6, 2024·0 cites·14 claims
- 4849US12013416B2Contact terminal, inspection jig, and inspection deviceNIDEC READ CORP·Filed 2020·Granted Jun 18, 2024·0 cites·20 claims
- 4949US9753075B2Inspection apparatus and inspection methodNIDEC-READ CORP·Filed 2014·Granted Sep 5, 2017·0 cites·11 claims
- 5048USD1065962SJigNIDEC READ CORP·Filed 2020·Granted Mar 11, 2025·1 cites·1 claims
Showing the top 50 of 84 patent records by PatentIndex Score.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →