Assignee
NIHON DENSHIZAIRYO KK
US·14 granted patents·3 pending applications·566 citations·filing 1990–2005
Top patents by PatentIndex Score
17 records- 0193US6853208B2Vertical probe cardNIHON DENSHIZAIRYO KK·Filed 2001·Granted Feb 8, 2005·64 cites·1 claims
- 0293US5670889AProbe card for maintaining the position of a probe in high temperature applicationNIHON DENSHIZAIRYO KK·Filed 1995·Granted Sep 23, 1997·136 cites·13 claims
- 0392US5134365AProbe card in which contact pressure and relative position of each probe end are correctly maintainedNIHON DENSHIZAIRYO KK·Filed 1991·Granted Jul 28, 1992·115 cites·1 claims
- 0490US5055778AProbe card in which contact pressure and relative position of each probe end are correctly maintainedNIHON DENSHIZAIRYO KK·Filed 1990·Granted Oct 8, 1991·97 cites·1 claims
- 0584US7307435B2Probe cardNIHON DENSHIZAIRYO KK·Filed 2005·Granted Dec 11, 2007·10 cites·5 claims
- 0683US7268568B2Probe cardNIHON DENSHIZAIRYO KK·Filed 2005·Granted Sep 11, 2007·9 cites·9 claims
- 0783US7075319B2Probe card having a coil spring interposed between a support member and a contactor unitNIHON DENSHIZAIRYO KK·Filed 2003·Granted Jul 11, 2006·29 cites·7 claims
- 0882US6300783B1Probe, manufacture of same, and vertically operative type probe card assembly employing sameNIHON DENSHIZAIRYO KK·Filed 1998·Granted Oct 9, 2001·45 cites·14 claims
- 0971US6294922B1Probe for testing a semiconductor integrated circuitNIHON DENSHIZAIRYO KK·Filed 1996·Granted Sep 25, 2001·28 cites·19 claims
- 1071USD424539SRing for probe cardNIHON DENSHIZAIRYO KK·Filed 1998·Granted May 9, 2000·17 cites·1 claims
- 1163US6980013B2Probe cardNIHON DENSHIZAIRYO KK·Filed 2004·Granted Dec 27, 2005·8 cites·7 claims
- 1245US7208964B2Probe cardNIHON DENSHIZAIRYO KK·Filed 2004·Granted Apr 24, 2007·3 cites·8 claims
- 1339US2005184743A1Probe cardNIHON DENSHIZAIRYO KK·Filed 2005·Application pending·0 cites
- 1439US2005184745A1Probe cardNIHON DENSHIZAIRYO KK·Filed 2005·Application pending·0 cites
- 1537USD420659SRing for probe cardNIHON DENSHIZAIRYO KK·Filed 1998·Granted Feb 15, 2000·3 cites·1 claims
- 1635US2005099195A1Probe sheet and probe sheet unit using sameNIHON DENSHIZAIRYO KK·Filed 2004·Application pending·0 cites
- 1733US6836024B2Apparatus for connecting between substratesNIHON DENSHIZAIRYO KK·Filed 2003·Granted Dec 28, 2004·2 cites·8 claims
Join the waitlist — get patent alerts
Get an alert when NIHON DENSHIZAIRYO KK files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →