Assignee
NIPPON MAXIS CO LTD
US·1 granted patent·1 pending application·26 citations·filing 1998–2001
Top patents by PatentIndex Score
2 records- 0162US6256091B1Transparent substrate mounting platform, transparent substrate scratch inspection device, transparent substrate bevelling inspection method and device, and transparent substrate inspection methodNIPPON MAXIS CO LTD·Filed 1998·Granted Jul 3, 2001·26 cites·19 claims
- 0232US2002030823A1Method and device for measuring thickness of test objectNIPPON MAXIS CO LTD·Filed 2001·Application pending·0 cites
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