Assignee
NPTEST INC
US·7 granted patents·3 pending applications·70 citations·filing 2002–2003
Top patents by PatentIndex Score
10 records- 0184US6940271B2Pin electronics interface circuitNPTEST INC·Filed 2002·Granted Sep 6, 2005·25 cites·19 claims
- 0269US6781218B1Method and apparatus for accessing internal nodes of an integrated circuit using IC package substrateNPTEST INC·Filed 2003·Granted Aug 24, 2004·16 cites·22 claims
- 0358US6522162B2Test system and associated interface moduleNPTEST INC·Filed 2002·Granted Feb 18, 2003·9 cites·12 claims
- 0453US6853941B2Open-loop for waveform acquisitionNPTEST INC·Filed 2002·Granted Feb 8, 2005·7 cites·19 claims
- 0548US6872581B2Measuring back-side voltage of an integrated circuitNPTEST INC·Filed 2002·Granted Mar 29, 2005·4 cites·25 claims
- 0648US6760223B2Apparatus and method for contacting device with delicate light-transparent paneNPTEST INC·Filed 2002·Granted Jul 6, 2004·6 cites·28 claims
- 0745US6822435B2Comparator circuit for differential swing comparison and common-mode voltage comparisonNPTEST INC·Filed 2002·Granted Nov 23, 2004·3 cites·17 claims
- 0837US2004084408A1Method for surface preparation to enable uniform etching of polycrystalline materialsNPTEST INC·Filed 2003·Application pending·0 cites
- 0937US2004084407A1Method for surface preparation to enable uniform etching of polycrystalline materialsNPTEST INC·Filed 2002·Application pending·0 cites
- 1036US2004187049A1Very small pin count IC testerNPTEST INC·Filed 2003·Application pending·0 cites
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