Assignee
OBUKI TOMOHARU
JP·1 granted patent·1 pending application·2 citations·filing 2010–2011
Top patents by PatentIndex Score
2 records- 0169US8178840B2Specimen inspection equipment and how to make the electron beam absorbed current imagesOBUKI TOMOHARU·Filed 2010·Granted May 15, 2012·2 cites·5 claims
- 0231US2013119999A1Specimen Testing Device and Method for Creating Absorbed Current ImageOBUKI TOMOHARU·Filed 2011·Application pending·0 cites
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