Assignee
OHTAKE HIDEYUKI
JP·3 granted patents·11 citations·filing 2009–2011
Top patents by PatentIndex Score
3 records- 0185US8513608B2Coating film inspection apparatus and inspection methodOHTAKE HIDEYUKI·Filed 2011·Granted Aug 20, 2013·9 cites·4 claims
- 0257US8497490B2Terahertz wave generation device and method for generating terahertz waveOHTAKE HIDEYUKI·Filed 2009·Granted Jul 30, 2013·1 cites·10 claims
- 0347US8450689B2Device and method for measuring thickness of paint film in non-contacting mannerOHTAKE HIDEYUKI·Filed 2009·Granted May 28, 2013·1 cites·4 claims
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