Assignee
OIKAZE HIROTOSHI
JP·3 granted patents·1 citations·filing 2009–2012
Top patents by PatentIndex Score
3 records- 0153US8619263B2Film thickness measuring apparatus using interference and film thickness measuring method using interferenceOIKAZE HIROTOSHI·Filed 2010·Granted Dec 31, 2013·1 cites·9 claims
- 0240US9241388B2Method and apparatus for manufacturing a light-emitting device including correction of an application amount of a fluorescent resin based on a fluorescent particle concentrationOIKAZE HIROTOSHI·Filed 2012·Granted Jan 19, 2016·0 cites·3 claims
- 0336US8294903B2Surface shape measurement apparatus and methodOIKAZE HIROTOSHI·Filed 2009·Granted Oct 23, 2012·0 cites·9 claims
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