Assignee
ON CHIP TECHNOLOGIES INC
US·9 granted patents·1 pending application·266 citations·filing 1999–2008
Top patents by PatentIndex Score
10 records- 0196US6687865B1On-chip service processor for test and debug of integrated circuitsON CHIP TECHNOLOGIES INC·Filed 1999·Granted Feb 3, 2004·110 cites·22 claims
- 0294US7353470B2Variable clocked scan test improvementsON CHIP TECHNOLOGIES INC·Filed 2005·Granted Apr 1, 2008·27 cites·18 claims
- 0388US7197681B2Accelerated scan circuitry and method for reducing scan test data volume and execution timeON CHIP TECHNOLOGIES INC·Filed 2004·Granted Mar 27, 2007·39 cites·12 claims
- 0488US7188286B2Accelerated scan circuitry and method for reducing scan test data volume and execution timeON CHIP TECHNOLOGIES INC·Filed 2004·Granted Mar 6, 2007·32 cites·6 claims
- 0585US7200784B2Accelerated scan circuitry and method for reducing scan test data volume and execution timeON CHIP TECHNOLOGIES INC·Filed 2004·Granted Apr 3, 2007·26 cites·7 claims
- 0685US7080301B2On-chip service processorON CHIP TECHNOLOGIES INC·Filed 2005·Granted Jul 18, 2006·8 cites·6 claims
- 0777US6964001B2On-chip service processorON CHIP TECHNOLOGIES INC·Filed 2004·Granted Nov 8, 2005·12 cites·6 claims
- 0868US7234092B2Variable clocked scan test circuitry and methodON CHIP TECHNOLOGIES INC·Filed 2003·Granted Jun 19, 2007·9 cites·10 claims
- 0960US7797595B2Serially decoded digital device testingON CHIP TECHNOLOGIES INC·Filed 2008·Granted Sep 14, 2010·3 cites·14 claims
- 1033US2006041798A1Design techniques to increase testing efficiencyON CHIP TECHNOLOGIES INC·Filed 2004·Application pending·0 cites
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