Assignee

OPTICAL SEMICONDUCTORS INC

US·2 granted patents·28 citations·filing 1992–1992

Technology mixC04B1 C09K1 C30B1 G01T1

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2 records

0162US5493121AMethod and apparatus for measuring incident radiationOPTICAL SEMICONDUCTORS INC·Filed 1992·Granted Feb 20, 1996·18 cites·85 claims
0251US5500147AScintillation solid and method of measuring radiationOPTICAL SEMICONDUCTORS INC·Filed 1992·Granted Mar 19, 1996·10 cites·12 claims

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