Assignee
OPTIMALTEST LTD
IL·9 granted patents·71 citations·filing 2005–2013
Top patents by PatentIndex Score
9 records- 0191US7340359B2Augmenting semiconductor's devices quality and reliabilityOPTIMALTEST LTD·Filed 2006·Granted Mar 4, 2008·23 cites·61 claims
- 0289US7969174B2Systems and methods for test time outlier detection and correction in integrated circuit testingOPTIMALTEST LTD·Filed 2009·Granted Jun 28, 2011·13 cites·15 claims
- 0384US7532024B2Methods and systems for semiconductor testing using reference diceOPTIMALTEST LTD·Filed 2006·Granted May 12, 2009·9 cites·17 claims
- 0480US7208969B2Optimize parallel testingOPTIMALTEST LTD·Filed 2005·Granted Apr 24, 2007·12 cites·21 claims
- 0572US7777515B2Methods and systems for semiconductor testing using reference diceOPTIMALTEST LTD·Filed 2008·Granted Aug 17, 2010·4 cites·22 claims
- 0667US7737716B2Methods and systems for semiconductor testing using reference diceOPTIMALTEST LTD·Filed 2008·Granted Jun 15, 2010·3 cites·17 claims
- 0767US7679392B2Methods and systems for semiconductor testing using reference diceOPTIMALTEST LTD·Filed 2008·Granted Mar 16, 2010·3 cites·2 claims
- 0864US7567947B2Methods and systems for semiconductor testing using a testing scenario languageOPTIMALTEST LTD·Filed 2006·Granted Jul 28, 2009·4 cites·29 claims
- 0954US8872538B2Systems and methods for test time outlier detection and correction in integrated circuit testingOPTIMALTEST LTD·Filed 2013·Granted Oct 28, 2014·0 cites·18 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →