Assignee
OSANAI YOSUKE
JP·2 granted patents·4 citations·filing 2012–2013
Top patents by PatentIndex Score
2 records- 0166US9379029B2Inspection apparatus, inspection system, inspection method of semiconductor devices, and manufacturing method of inspected semiconductor devicesOSANAI YOSUKE·Filed 2012·Granted Jun 28, 2016·2 cites·10 claims
- 0260US9660512B2Electronic device for acquiring specific information of respective switching elementsOSANAI YOSUKE·Filed 2013·Granted May 23, 2017·2 cites·5 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →