Assignee
OSHIDA DAISUKE
JP·8 granted patents·1 pending application·30 citations·filing 2008–2012
Top patents by PatentIndex Score
9 records- 0187US9337093B2Method of manufacturing semiconductor deviceOSHIDA DAISUKE·Filed 2011·Granted May 10, 2016·10 cites·4 claims
- 0282US8782432B2Semiconductor deviceOSHIDA DAISUKE·Filed 2012·Granted Jul 15, 2014·6 cites·11 claims
- 0373US9026882B2Semiconductor device and method of writing data to semiconductor deviceOSHIDA DAISUKE·Filed 2012·Granted May 5, 2015·3 cites·25 claims
- 0473US8486836B2Semiconductor device and method of manufacturing the sameOSHIDA DAISUKE·Filed 2011·Granted Jul 16, 2013·3 cites·8 claims
- 0570US9177857B2Semiconductor device with high reliability and manufacturing method thereofOSHIDA DAISUKE·Filed 2009·Granted Nov 3, 2015·4 cites·12 claims
- 0668US8299621B2Semiconductor device having wiring layer with a wide wiring and fine wiringsOSHIDA DAISUKE·Filed 2009·Granted Oct 30, 2012·2 cites·18 claims
- 0765US8174011B2Positional offset measurement pattern unit featuring via-plug and interconnections, and method using such positional offset measurement pattern unitOSHIDA DAISUKE·Filed 2008·Granted May 8, 2012·2 cites·16 claims
- 0852US8426975B2Semiconductor device having wiring layer with a wide wiring and fine wiringsOSHIDA DAISUKE·Filed 2012·Granted Apr 23, 2013·0 cites·15 claims
- 0947US2012231623A1Method of manufacturing a high-reliability semiconductor deviceOSHIDA DAISUKE·Filed 2012·Application pending·0 cites
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