Assignee
OTANI YUKO
JP·2 granted patents·1 pending application·4 citations·filing 2010–2012
Top patents by PatentIndex Score
3 records- 0173US9773641B2Method and apparatus for observing defectsOTANI YUKO·Filed 2011·Granted Sep 26, 2017·3 cites·16 claims
- 0270US8953156B2Defect detection method and defect detection device and defect observation device provided with sameOTANI YUKO·Filed 2010·Granted Feb 10, 2015·1 cites·12 claims
- 0337US2014204194A1Defect observation method and device thereforOTANI YUKO·Filed 2012·Application pending·0 cites
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