Assignee
OTSUKA DENSHI KK
JP·68 granted patents·14 pending applications·668 citations·filing 1988–2025
Top patents by PatentIndex Score
82 records- 0193US10120177B2Optical characteristic measurement apparatus and optical systemOTSUKA DENSHI KK·Filed 2016·Granted Nov 6, 2018·8 cites·7 claims
- 0287US7528967B2Optical characteristic measuring apparatus and measuring method using light reflected from object to be measuredOTSUKA DENSHI KK·Filed 2008·Granted May 5, 2009·16 cites·13 claims
- 0386US5057695AMethod of and apparatus for measuring the inside information of substance with the use of light scatteringOTSUKA DENSHI KK·Filed 1989·Granted Oct 15, 1991·284 cites·8 claims
- 0485US7808625B2Aperture variable inspection optical system and color filter evaluation processOTSUKA DENSHI KK·Filed 2007·Granted Oct 5, 2010·11 cites·3 claims
- 0584US7176464B2Method of and apparatus for determining the amount of impurity in gasOTSUKA DENSHI KK·Filed 2005·Granted Feb 13, 2007·14 cites·6 claims
- 0682US10309767B2Optical measurement apparatus and optical measurement methodOTSUKA DENSHI KK·Filed 2018·Granted Jun 4, 2019·3 cites·11 claims
- 0781US10222261B2Optical characteristic measurement system and calibration method for optical characteristic measurement systemOTSUKA DENSHI KK·Filed 2016·Granted Mar 5, 2019·3 cites·10 claims
- 0880US10429238B2Optical measurement method and optical measurement apparatusOTSUKA DENSHI KK·Filed 2017·Granted Oct 1, 2019·4 cites·5 claims
- 0978US6859274B2Light spectrum detecting apparatusOTSUKA DENSHI KK·Filed 2001·Granted Feb 22, 2005·26 cites·2 claims
- 1077US10288412B2Optical measurement apparatus and optical measurement methodOTSUKA DENSHI KK·Filed 2018·Granted May 14, 2019·2 cites·10 claims
- 1177US9891105B2Microspectroscope including optical fibers and spectroscopeOTSUKA DENSHI KK·Filed 2016·Granted Feb 13, 2018·3 cites·6 claims
- 1276US6879395B2Spectrum measuring instrumentOTSUKA DENSHI KK·Filed 2001·Granted Apr 12, 2005·22 cites·4 claims
- 1374US9127832B2Light source support apparatus and optical radiation characteristic measurement apparatus using the sameOTSUKA DENSHI KK·Filed 2013·Granted Sep 8, 2015·3 cites·12 claims
- 1474US7663744B2Integrating photometer for measuring total flux of light generated from light source to be measured, and method for measuring total flux of light through use of the sameOTSUKA DENSHI KK·Filed 2008·Granted Feb 16, 2010·7 cites·8 claims
- 1573US7394483B2Display evaluation method and apparatusOTSUKA DENSHI KK·Filed 2005·Granted Jul 1, 2008·7 cites·7 claims
- 1673US4922309ASpectroscopeOTSUKA DENSHI KK·Filed 1988·Granted May 1, 1990·35 cites·2 claims
- 1769USD869310SSample analyzerOTSUKA DENSHI KK·Filed 2018·Granted Dec 10, 2019·13 cites·1 claims
- 1869US8970835B2Optical characteristic measuring apparatusOTSUKA DENSHI KK·Filed 2012·Granted Mar 3, 2015·2 cites·3 claims
- 1967US7483550B2Method and system for evaluating moving image quality of displaysOTSUKA DENSHI KK·Filed 2004·Granted Jan 27, 2009·11 cites·8 claims
- 2066US5239365AMethod of measuring thickness of liquid crystal cellsOTSUKA DENSHI KK·Filed 1992·Granted Aug 24, 1993·34 cites·1 claims
- 2165US9488568B2Polarization analysis apparatusOTSUKA DENSHI KK·Filed 2014·Granted Nov 8, 2016·1 cites·5 claims
- 2265US5015094AParticle size measuring systemOTSUKA DENSHI KK·Filed 1989·Granted May 14, 1991·28 cites·3 claims
- 2364US10795067B2Confocal optical system-based measurement apparatus and method for manufacturing confocal optical system-based measurement apparatusOTSUKA DENSHI KK·Filed 2019·Granted Oct 6, 2020·1 cites·5 claims
- 2464US10480997B1Optical measurement apparatus and optical measurement methodOTSUKA DENSHI KK·Filed 2019·Granted Nov 19, 2019·1 cites·16 claims
- 2564US10330530B2Reference light source device used for calibration of spectral luminance meter and calibration method using sameOTSUKA DENSHI KK·Filed 2015·Granted Jun 25, 2019·1 cites·14 claims
- 2664US10127472B2Light distribution characteristic measurement apparatus and light distribution characteristic measurement methodOTSUKA DENSHI KK·Filed 2016·Granted Nov 13, 2018·1 cites·10 claims
- 2764US8982341B2Light distribution characteristic measurement apparatus and light distribution characteristic measurement methodOTSUKA DENSHI KK·Filed 2013·Granted Mar 17, 2015·2 cites·12 claims
- 2864US7236250B2Dynamic light scattering measurement apparatus using phase modulation interference methodOTSUKA DENSHI KK·Filed 2004·Granted Jun 26, 2007·6 cites·10 claims
- 2963US2025377299A1Optical measurement system and non-transitory storage mediumOTSUKA DENSHI KK·Filed 2025·Application pending·0 cites
- 3061US7847819B2Measurement system for evaluating moving image quality of displaysOTSUKA DENSHI KK·Filed 2003·Granted Dec 7, 2010·4 cites·11 claims
- 3161US7251035B2Optical cell measurement apparatusOTSUKA DENSHI KK·Filed 2005·Granted Jul 31, 2007·1 cites·4 claims
- 3261US5333610AAbsorption spectrum determining method and spectrometric measuring apparatus for light-diffusive object using the methodOTSUKA DENSHI KK·Filed 1992·Granted Aug 2, 1994·24 cites·4 claims
- 3360US10422694B2Optical characteristic measurement system and calibration method for optical characteristic measurement systemOTSUKA DENSHI KK·Filed 2019·Granted Sep 24, 2019·0 cites·12 claims
- 3460US2025305961A1Physical property value calculation method for polymer material, physical property value calculation device for polymer material, and information storage mediumOTSUKA DENSHI KK·Filed 2025·Application pending·0 cites
- 3559US10422695B2Optical characteristic measurement system and calibration method for optical characteristic measurement systemOTSUKA DENSHI KK·Filed 2019·Granted Sep 24, 2019·0 cites·5 claims
- 3657US12411108B2Zeta-potential measurement jig setOTSUKA DENSHI KK·Filed 2023·Granted Sep 9, 2025·0 cites·17 claims
- 3757US8896823B2Light distribution characteristic measurement apparatus and light distribution characteristic measurement methodOTSUKA DENSHI KK·Filed 2013·Granted Nov 25, 2014·1 cites·14 claims
- 3856US11953465B2Zeta-potential measurement jigOTSUKA DENSHI KK·Filed 2021·Granted Apr 9, 2024·0 cites·9 claims
- 3956US5638167AMethod of measuring the light amount of a display picture element, display screen inspecting method and display screen inspecting apparatusOTSUKA DENSHI KK·Filed 1995·Granted Jun 10, 1997·23 cites·14 claims
- 4055US11598713B2Particle size measurement method, particle size measurement apparatus, and particle size measurement programOTSUKA DENSHI KK·Filed 2021·Granted Mar 7, 2023·0 cites·6 claims
- 4155US9163985B2Spectral characteristic measurement apparatus and spectral characteristic measurement methodOTSUKA DENSHI KK·Filed 2013·Granted Oct 20, 2015·1 cites·6 claims
- 4255US5157454ADifferential refractometerOTSUKA DENSHI KK·Filed 1990·Granted Oct 20, 1992·23 cites·15 claims
- 4354US6750967B2Light scattering measuring probeOTSUKA DENSHI KK·Filed 2002·Granted Jun 15, 2004·1 cites·8 claims
- 4453US6922247B2Automatic optical measurement methodOTSUKA DENSHI KK·Filed 2001·Granted Jul 26, 2005·4 cites·3 claims
- 4552US12174103B2Light scattering measuring apparatus and measuring jigOTSUKA DENSHI KK·Filed 2021·Granted Dec 24, 2024·0 cites·14 claims
- 4652US12023429B2Photodynamic therapy device and photodynamic therapy device cartridgeOTSUKA DENSHI KK·Filed 2019·Granted Jul 2, 2024·0 cites·20 claims
- 4751US9377352B2Standard light source having restriction portion for diffuse reflection and measurement methodOTSUKA DENSHI KK·Filed 2014·Granted Jun 28, 2016·0 cites·12 claims
- 4851US8896824B2Optical characteristic measuring apparatusOTSUKA DENSHI KK·Filed 2013·Granted Nov 25, 2014·0 cites·10 claims
- 4951US6885448B2Photon correlatorOTSUKA DENSHI KK·Filed 2002·Granted Apr 26, 2005·4 cites·1 claims
- 5051US2008238820A1Motion picture image processing system and motion picture image processing methodOTSUKA DENSHI KK·Filed 2008·Application pending·0 cites
Showing the top 50 of 82 patent records by PatentIndex Score.
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