Assignee
OZAWA TETSUYA
JP·3 granted patents·17 citations·filing 2010–2011
Top patents by PatentIndex Score
3 records- 0190US9336917B2X-ray apparatus, method of using the same and X-ray irradiation methodOZAWA TETSUYA·Filed 2010·Granted May 10, 2016·12 cites·12 claims
- 0278US9074992B2X-ray diffraction apparatus and X-ray diffraction measurement methodOZAWA TETSUYA·Filed 2011·Granted Jul 7, 2015·3 cites·16 claims
- 0370US8991641B2Pressure vessel and method of manufacturing the sameOZAWA TETSUYA·Filed 2011·Granted Mar 31, 2015·2 cites·2 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →