Assignee
PAHK HEUI-JAE
KR·6 granted patents·53 citations·filing 1998–2009
Top patents by PatentIndex Score
6 records- 0167US7113273B2Machine and method for inspecting ferrule of optical connectorPAHK HEUI-JAE·Filed 2003·Granted Sep 26, 2006·17 cites·12 claims
- 0262US6005669ANon contact measuring method for three dimensional micro pattern in measuring objectPAHK HEUI JAE·Filed 1998·Granted Dec 21, 1999·27 cites·5 claims
- 0357US8279447B2Method for measuring thicknessPAHK HEUI-JAE·Filed 2008·Granted Oct 2, 2012·3 cites·9 claims
- 0457US8199332B2Apparatus for measuring thicknessPAHK HEUI-JAE·Filed 2008·Granted Jun 12, 2012·3 cites·5 claims
- 0547US7243571B2Ultra-precision positioning systemPAHK HEUI-JAE·Filed 2001·Granted Jul 17, 2007·2 cites·9 claims
- 0644US8947673B2Estimating thickness based on number of peaks between two peaks in scanning white light interferometryPAHK HEUI JAE·Filed 2009·Granted Feb 3, 2015·1 cites·7 claims
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