Assignee
PARK ALLEN
US·4 granted patents·1 pending application·47 citations·filing 2008–2014
Top patents by PatentIndex Score
5 records- 0193US8194968B2Methods and systems for using electrical information for a device being fabricated on a wafer to perform one or more defect-related functionsPARK ALLEN·Filed 2008·Granted Jun 5, 2012·33 cites·85 claims
- 0285US8594823B2Scanner performance comparison and matching using design and defect dataPARK ALLEN·Filed 2010·Granted Nov 26, 2013·9 cites·12 claims
- 0376US8656323B2Based device risk assessmentPARK ALLEN·Filed 2012·Granted Feb 18, 2014·4 cites·4 claims
- 0464US10030959B2Blasting systems and methodsPARK ALLEN·Filed 2014·Granted Jul 24, 2018·1 cites·16 claims
- 0546US2012316855A1Using Three-Dimensional Representations for Defect-Related ApplicationsPARK ALLEN·Filed 2011·Application pending·0 cites
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