Assignee
PARK SYSTEMS CORP
KR·16 granted patents·6 pending applications·17 citations·filing 2006–2025
Top patents by PatentIndex Score
22 records- 0188US12584942B1Measurement system with detection mechanism and method of operation thereofPARK SYSTEMS CORP·Filed 2025·Granted Mar 24, 2026·1 cites·20 claims
- 0278US2026023095A1Apparatus and method for identifying target position in atomic force microscopePARK SYSTEMS CORP·Filed 2025·Application pending·0 cites
- 0376US12038455B2Measuring method for measuring heat distribution of specific space using SThM probe, method and device for detecting beam spot of light sourcePARK SYSTEMS CORP·Filed 2023·Granted Jul 16, 2024·0 cites·4 claims
- 0476US7709791B2Scanning probe microscope with automatic probe replacement functionPARK SYSTEMS CORP·Filed 2007·Granted May 4, 2010·7 cites·20 claims
- 0567US12584941B1Measurement system with detection mechanism and method of operation thereofPARK SYSTEMS CORP·Filed 2025·Granted Mar 24, 2026·0 cites·20 claims
- 0667US12584866B1Measurement system with detection mechanism and method of operation thereofPARK SYSTEMS CORP·Filed 2025·Granted Mar 24, 2026·0 cites·20 claims
- 0764US7514679B2Scanning probe microscope for measuring angle and method of measuring a sample using the samePARK SYSTEMS CORP·Filed 2006·Granted Apr 7, 2009·2 cites·11 claims
- 0862US11598788B2Measuring method for measuring heat distribution of specific space using SThM probe, method and device for detecting beam spot of light sourcePARK SYSTEMS CORP·Filed 2021·Granted Mar 7, 2023·0 cites·3 claims
- 0960US7644447B2Scanning probe microscope capable of measuring samples having overhang structurePARK SYSTEMS CORP·Filed 2006·Granted Jan 5, 2010·7 cites·10 claims
- 1059US2023204624A1Apparatus and method for identifying target position in atomic force microscopePARK SYSTEMS CORP·Filed 2021·Application pending·0 cites
- 1156US11761981B2Method and apparatus for identifying sample position in atomic force microscopePARK SYSTEMS CORP·Filed 2021·Granted Sep 19, 2023·0 cites·16 claims
- 1251US11619649B1Atomic force microscope equipped with optical measurement device and method of acquiring information on surface of measurement target using the samePARK SYSTEMS CORP·Filed 2021·Granted Apr 4, 2023·0 cites·12 claims
- 1349US12399195B2Method for measuring, by measurement device, characteristics of surface of object to be measured, atomic force microscope for performing same method, and computer program stored in storage medium to perform same methodPARK SYSTEMS CORP·Filed 2021·Granted Aug 26, 2025·0 cites·11 claims
- 1448US11175308B2Chip carrier exchanging device and atomic force microscopy apparatus having samePARK SYSTEMS CORP·Filed 2020·Granted Nov 16, 2021·0 cites·8 claims
- 1548US9645168B2Head limiting movement range of laser spot and atomic force microscope having the samePARK SYSTEMS CORP·Filed 2015·Granted May 9, 2017·0 cites·10 claims
- 1639US10133052B2Image acquiring method and image acquiring apparatus using the samePARK SYSTEMS CORP·Filed 2014·Granted Nov 20, 2018·0 cites·8 claims
- 1739US2023324434A1Method for measuring characteristics of surface of object to be measured by means of measuring apparatus using variable set point setting, atomic microscope for performing method, and computer program stored in storage medium for performing methodPARK SYSTEMS CORP·Filed 2021·Application pending·0 cites
- 1838US2009200462A1Scanning probe microscope capable of measuring samples having overhang structurePARK SYSTEMS CORP·Filed 2009·Application pending·0 cites
- 1938US2023046236A1Method for obtaining characteristics of surface to be measured, by using inclined tip, atomic force microscope for performing method, and computer program stored in storage medium in order to perform methodPARK SYSTEMS CORP·Filed 2020·Application pending·0 cites
- 2034US9645169B2Measurement apparatus and method with adaptive scan ratePARK SYSTEMS CORP·Filed 2015·Granted May 9, 2017·0 cites·18 claims
- 2132US2010218285A1Scanning probe microscope capable of measuring samples having overhang structurePARK SYSTEMS CORP·Filed 2010·Application pending·0 cites
- 2229US9081272B2Leveling apparatus and atomic force microscope including the samePARK SYSTEMS CORP·Filed 2014·Granted Jul 14, 2015·0 cites·8 claims
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