Assignee

PATON ERIC N

1 granted patent·78 citations·filing 2000–2000

Technology mixG01D1 H10P1 Y10T1

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0191US6966235B1Remote monitoring of critical parameters for calibration of manufacturing equipment and facilitiesPATON ERIC N·Filed 2000·Granted Nov 22, 2005·78 cites·1 claims

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