Assignee
PHICOM CORP
KR·18 granted patents·2 pending applications·130 citations·filing 2003–2008
Top patents by PatentIndex Score
20 records- 0190US7285966B2Probe and method of making samePHICOM CORP·Filed 2004·Granted Oct 23, 2007·42 cites·6 claims
- 0286US8012331B2Probe and method of making samePHICOM CORP·Filed 2007·Granted Sep 6, 2011·13 cites·2 claims
- 0379US7867790B2Substrate of probe card and method for regenerating thereofPHICOM CORP·Filed 2006·Granted Jan 11, 2011·8 cites·4 claims
- 0475US7678587B2Cantilever-type probe and method of fabricating the samePHICOM CORP·Filed 2006·Granted Mar 16, 2010·6 cites·10 claims
- 0571US7602204B2Probe card manufacturing method including sensing probe and the probe card, probe card inspection systemPHICOM CORP·Filed 2005·Granted Oct 13, 2009·5 cites·13 claims
- 0671US7503811B2Interconnection device for a printed circuit board, a method of manufacturing the same, and an interconnection assembly having the samePHICOM CORP·Filed 2007·Granted Mar 17, 2009·12 cites·5 claims
- 0767US7804312B2Silicon wafer for probe bonding and probe bonding method using thereofPHICOM CORP·Filed 2005·Granted Sep 28, 2010·2 cites·12 claims
- 0865US7886957B2Method of bonding probes and method of manufacturing a probe card using the samePHICOM CORP·Filed 2007·Granted Feb 15, 2011·3 cites·9 claims
- 0965US7319773B2Subminiature bone vibrating speaker using the diaphragm and mobile phone therebyPHICOM CORP·Filed 2003·Granted Jan 15, 2008·11 cites·9 claims
- 1064US7466833B2Bone vibrating speaker using the diaphragm and mobile phone therebyPHICOM CORP·Filed 2003·Granted Dec 16, 2008·10 cites·10 claims
- 1161US7579855B2Method for manufacturing electrical contact element for testing electronic device and electrical contact element manufactured therebyPHICOM CORP·Filed 2006·Granted Aug 25, 2009·1 cites·22 claims
- 1260US7975380B2Method of fabricating a probe cardPHICOM CORP·Filed 2006·Granted Jul 12, 2011·2 cites·7 claims
- 1360US7859280B2Probe card for testing semiconductor devicesPHICOM CORP·Filed 2006·Granted Dec 28, 2010·2 cites·7 claims
- 1460US7119557B2Hollow microprobe using a MEMS technique and a method of manufacturing the samePHICOM CORP·Filed 2003·Granted Oct 10, 2006·8 cites·37 claims
- 1558US7511524B1Contact tip structure of a connecting elementPHICOM CORP·Filed 2008·Granted Mar 31, 2009·3 cites·36 claims
- 1655US7830162B2Vertical probe and methods of fabricating and bonding the samePHICOM CORP·Filed 2006·Granted Nov 9, 2010·2 cites·5 claims
- 1741US2009151159A1Method for arranging a plurality of connecting elementsPHICOM CORP·Filed 2008·Application pending·0 cites
- 1841US2009184727A1Space Transformer, Manufacturing Method of the Space Transformer and Probe Card Having the Space TransformerPHICOM CORP·Filed 2007·Application pending·0 cites
- 1938US7592565B2Probe positioning and bonding device and probe bonding methodPHICOM CORP·Filed 2004·Granted Sep 22, 2009·0 cites·12 claims
- 2026US7675305B2Vertical-type electric contactor and manufacture method thereofPHICOM CORP·Filed 2005·Granted Mar 9, 2010·0 cites·11 claims
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