Assignee
PHOTOSENSE LLC
US·2 granted patents·67 citations·filing 1998–2000
Technology mixG01N2
Top patents by PatentIndex Score
2 records- 0180US6157037ASensing device and method for measuring emission time delay during irradiation of targeted samplesPHOTOSENSE LLC·Filed 1998·Granted Dec 5, 2000·61 cites·26 claims
- 0263US7084409B1Sensing device and method for measuring emission time delay during irradiation of targeted samples utilizing variable phase trackingPHOTOSENSE LLC·Filed 2000·Granted Aug 1, 2006·6 cites·10 claims
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