Assignee
POLLAK FRED H
US·4 granted patents·88 citations·filing 1989–1990
Top patents by PatentIndex Score
4 records- 0167US5260772AMethod and apparatus for determining a material's characteristics by photoreflectancePOLLAK FRED H·Filed 1989·Granted Nov 9, 1993·27 cites·39 claims
- 0261US5255070AMethod for determining interface properties of semiconductor materials by photoreflectancePOLLAK FRED H·Filed 1989·Granted Oct 19, 1993·22 cites·4 claims
- 0361US5255071APhotoreflectance method and apparatus utilizing acousto-optic modulationPOLLAK FRED H·Filed 1989·Granted Oct 19, 1993·20 cites·20 claims
- 0446US5159410AMethod for in-situ determination of the fermi level in GaAs and similar materials by photoreflectancePOLLAK FRED H·Filed 1990·Granted Oct 27, 1992·19 cites·10 claims
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