Assignee
PRECITEC OPTRONIK GMBH
DE·21 granted patents·8 pending applications·128 citations·filing 2012–2025
Top patents by PatentIndex Score
29 records- 0194US8982339B2Material-working device with in-situ measurement of the working distancePRECITEC OPTRONIK GMBH·Filed 2012·Granted Mar 17, 2015·36 cites·17 claims
- 0293US10731965B1Phosphor light source for CLS or multipointPRECITEC OPTRONIK GMBH·Filed 2019·Granted Aug 4, 2020·8 cites·11 claims
- 0393US10466357B1Optical measuring devicePRECITEC OPTRONIK GMBH·Filed 2019·Granted Nov 5, 2019·9 cites·12 claims
- 0492US10228551B1Device and method for optically measuring a measurement objectPRECITEC OPTRONIK GMBH·Filed 2018·Granted Mar 12, 2019·23 cites·16 claims
- 0591US9677871B2Optical measuring method and measuring device having a measuring head for capturing a surface topography by calibrating the orientation of the measuring headPRECITEC OPTRONIK GMBH·Filed 2015·Granted Jun 13, 2017·10 cites·15 claims
- 0689US9982994B2Optical measuring method and measuring device having a measuring head for capturing a surface topography by calibrating the orientation of the measuring headPRECITEC OPTRONIK GMBH·Filed 2017·Granted May 29, 2018·7 cites·27 claims
- 0788US10234265B2Distance measuring device and method for measuring distancesPRECITEC OPTRONIK GMBH·Filed 2017·Granted Mar 19, 2019·6 cites·20 claims
- 0886US10725178B2Optical measuring devicePRECITEC OPTRONIK GMBH·Filed 2019·Granted Jul 28, 2020·4 cites·13 claims
- 0985US10695863B1Method and device for the controlled machining of a workpiecePRECITEC OPTRONIK GMBH·Filed 2019·Granted Jun 30, 2020·4 cites·22 claims
- 1084US9500471B2Optical measuring device and method for acquiring in situ a stage height between a support and an edge region of an objectPRECITEC OPTRONIK GMBH·Filed 2014·Granted Nov 22, 2016·11 cites·15 claims
- 1183US12264914B2Device and method for measuring wafersPRECITEC OPTRONIK GMBH·Filed 2024·Granted Apr 1, 2025·1 cites·14 claims
- 1275US10260941B2Chromatic confocal distance sensorPRECITEC OPTRONIK GMBH·Filed 2016·Granted Apr 16, 2019·3 cites·13 claims
- 1370US11460577B2Distance measuring devicePRECITEC OPTRONIK GMBH·Filed 2018·Granted Oct 4, 2022·1 cites·23 claims
- 1469US9230817B2Apparatus and method for monitoring a thickness of a silicon wafer with a highly doped layerPRECITEC OPTRONIK GMBH·Filed 2014·Granted Jan 5, 2016·2 cites·37 claims
- 1567US10449631B2Machining head for a laser machining devicePRECITEC OPTRONIK GMBH·Filed 2015·Granted Oct 22, 2019·2 cites·12 claims
- 1665US2025198743A1Device and method for measuring wafersPRECITEC OPTRONIK GMBH·Filed 2025·Application pending·0 cites
- 1763US2025189299A1Device and Method for Measuring WafersPRECITEC OPTRONIK GMBH·Filed 2023·Application pending·0 cites
- 1860US11219967B2Machining head for a laser machining devicePRECITEC OPTRONIK GMBH·Filed 2019·Granted Jan 11, 2022·0 cites·11 claims
- 1957US10571249B1Optical measuring device and methodPRECITEC OPTRONIK GMBH·Filed 2019·Granted Feb 25, 2020·1 cites·9 claims
- 2053US2024393261A1Apparatus and method for measuring wafersPRECITEC OPTRONIK GMBH·Filed 2024·Application pending·0 cites
- 2152US12467733B2Chromatic confocal measuring devicePRECITEC OPTRONIK GMBH·Filed 2021·Granted Nov 11, 2025·0 cites·20 claims
- 2247US11027364B2Method and device for measuring the depth of the vapor capillary during a machining process with a high-energy beamPRECITEC OPTRONIK GMBH·Filed 2016·Granted Jun 8, 2021·0 cites·20 claims
- 2347US2024377186A1Method and device for measuring optical thicknessPRECITEC OPTRONIK GMBH·Filed 2022·Application pending·0 cites
- 2446US2024167808A1Chromatic confocal measuring system for high-speed distance measurementPRECITEC OPTRONIK GMBH·Filed 2022·Application pending·0 cites
- 2545US2026022932A1Device for chromatic confocal measurement of distancesPRECITEC OPTRONIK GMBH·Filed 2023·Application pending·0 cites
- 2638US10762348B2Method and apparatus for determining the position and/or the orientation of an eyePRECITEC OPTRONIK GMBH·Filed 2016·Granted Sep 1, 2020·0 cites·20 claims
- 2738US9770783B2Method for measuring the distance between a workpiece and a machining head of a laser machining apparatusPRECITEC OPTRONIK GMBH·Filed 2015·Granted Sep 26, 2017·0 cites·15 claims
- 2833US2016202045A1Method of measuring the depth of penetration of a laser beam into a workpiecePRECITEC OPTRONIK GMBH·Filed 2016·Application pending·0 cites
- 2929US2023148378A1Method for determining the position of a flap cut on a cornea and of the hinge belonging to the flap, and device for carrying out a method of this typePRECITEC OPTRONIK GMBH·Filed 2021·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →