Assignee
PROBE TECHNOLOGY
US·6 granted patents·681 citations·filing 1995–1997
Top patents by PatentIndex Score
6 records- 0197US5720098AMethod for making a probe preserving a uniform stress distribution under deflectionPROBE TECHNOLOGY·Filed 1995·Granted Feb 24, 1998·169 cites·6 claims
- 0296US5742174AMembrane for holding a probe tip in proper locationPROBE TECHNOLOGY·Filed 1995·Granted Apr 21, 1998·198 cites·20 claims
- 0395US5764072ADual contact probe assembly for testing integrated circuitsPROBE TECHNOLOGY·Filed 1996·Granted Jun 9, 1998·128 cites·17 claims
- 0487US5884395AAssembly structure for making integrated circuit chip probe cardsPROBE TECHNOLOGY·Filed 1997·Granted Mar 23, 1999·76 cites·21 claims
- 0584US5751157AMethod and apparatus for aligning probesPROBE TECHNOLOGY·Filed 1996·Granted May 12, 1998·58 cites·36 claims
- 0682US5644249AMethod and circuit testing apparatus for equalizing a contact force between probes and padsPROBE TECHNOLOGY·Filed 1996·Granted Jul 1, 1997·52 cites·18 claims
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