Assignee

PROBE TECHNOLOGY INC

US·2 granted patents·156 citations·filing 1997–1998

Technology mixG01R2

Top patents by PatentIndex Score

2 records

0190US6064215AHigh temperature probe card for testing integrated circuitsPROBE TECHNOLOGY INC·Filed 1998·Granted May 16, 2000·82 cites·43 claims
0286US6204674B1Assembly structure for making integrated circuit chip probe cardsPROBE TECHNOLOGY INC·Filed 1997·Granted Mar 20, 2001·74 cites·5 claims

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