Assignee
PROKSCH ROGER
9 granted patents·4 pending applications·54 citations·filing 2006–2013
Top patents by PatentIndex Score
13 records- 0193US8302456B2Active damping of high speed scanning probe microscope componentsPROKSCH ROGER·Filed 2007·Granted Nov 6, 2012·15 cites·27 claims
- 0292US8925376B2Fully digitally controller for cantilever-based instrumentsPROKSCH ROGER·Filed 2012·Granted Jan 6, 2015·9 cites·11 claims
- 0389US8205488B2Fully digitally controller for cantilever-based instrumentsPROKSCH ROGER·Filed 2010·Granted Jun 26, 2012·7 cites·9 claims
- 0487US8502525B2Integrated micro actuator and IVDT for high precision position measurementsPROKSCH ROGER·Filed 2009·Granted Aug 6, 2013·9 cites·30 claims
- 0584US8677809B2Thermal measurements using multiple frequency atomic force microscopyPROKSCH ROGER·Filed 2010·Granted Mar 25, 2014·6 cites·2 claims
- 0684US7459904B2Precision position sensor using a nonmagnetic coil formPROKSCH ROGER·Filed 2007·Granted Dec 2, 2008·7 cites·4 claims
- 0768US8555711B2Material property measurements using multiple frequency atomic fore microscopyPROKSCH ROGER·Filed 2011·Granted Oct 15, 2013·1 cites·26 claims
- 0855US2014041084A1Material Property Measurements Using Multiple Frequency Atomic Fore MicroscopyPROKSCH ROGER·Filed 2013·Application pending·0 cites
- 0954US2006186878A1Linear variable differential transformers for high precision position measurementsPROKSCH ROGER·Filed 2006·Application pending·0 cites
- 1053US9518814B2Integrated micro actuator and LVDT for high precision position measurementsPROKSCH ROGER·Filed 2013·Granted Dec 13, 2016·0 cites·6 claims
- 1152US8763475B2Active damping of high speed scanning probe microscope componentsPROKSCH ROGER·Filed 2012·Granted Jul 1, 2014·0 cites·16 claims
- 1251US2014223612A1Modular Atomic Force MicroscopePROKSCH ROGER·Filed 2013·Application pending·0 cites
- 1351US2012079633A1Apparatus and Method for Isolating and Measuring Movement in Metrology ApparatusPROKSCH ROGER·Filed 2011·Application pending·0 cites
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