Assignee
PSIA CORP
KR·4 granted patents·1 pending application·138 citations·filing 1998–2005
Top patents by PatentIndex Score
5 records- 0180US6185991B1Method and apparatus for measuring mechanical and electrical characteristics of a surface using electrostatic force modulation microscopy which operates in contact modePSIA CORP·Filed 1998·Granted Feb 13, 2001·80 cites·52 claims
- 0275US6951129B2Scanning probe microscope with improved probe head mountPSIA CORP·Filed 2004·Granted Oct 4, 2005·18 cites·13 claims
- 0374US6677567B2Scanning probe microscope with improved scan accuracy, scan speed, and optical visionPSIA CORP·Filed 2002·Granted Jan 13, 2004·20 cites·7 claims
- 0470US6945100B2Scanning probe microscope with improved probe tip mountPSIA CORP·Filed 2003·Granted Sep 20, 2005·20 cites·18 claims
- 0533US2007012874A1Apparatus for and method of driving X-Y scanner in scanning probe microscopePSIA CORP·Filed 2005·Application pending·0 cites
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