Assignee
PVA TEPLA ANALYTICAL SYSTEMS GMBH
DE·1 granted patent·4 pending applications·0 citations·filing 2018–2024
Top patents by PatentIndex Score
5 records- 0159US2025116634A1Method for automated defect classification in scanning acoustic microscopy and scanning acoustic microscopePVA TEPLA ANALYTICAL SYSTEMS GMBH·Filed 2024·Application pending·0 cites
- 0257US2025110237A1Method for operating a scanning acoustic microscopePVA TEPLA ANALYTICAL SYSTEMS GMBH·Filed 2024·Application pending·0 cites
- 0350US2025110086A1Transducer attachment body for a probe, having at least one transducer and one lens, of an acoustic microscope, an acoustic microscope, and method of performing an ultra-sound scanning microscopyPVA TEPLA ANALYTICAL SYSTEMS GMBH·Filed 2024·Application pending·0 cites
- 0433US2022328341A1Wafer chuck for handling a waferPVA TEPLA ANALYTICAL SYSTEMS GMBH·Filed 2022·Application pending·0 cites
- 0519US12510644B2Ultrasonic microscope and carrier for carrying an acoustic pulse transducerPVA TEPLA ANALYTICAL SYSTEMS GMBH·Filed 2018·Granted Dec 30, 2025·0 cites·25 claims
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