Assignee
QCEPT TECHNOLOGIES INC
US·12 granted patents·102 citations·filing 2003–2008
Top patents by PatentIndex Score
12 records- 0192US7107158B2Inspection system and apparatusQCEPT TECHNOLOGIES INC·Filed 2005·Granted Sep 12, 2006·18 cites·35 claims
- 0291US7634365B2Inspection system and apparatusQCEPT TECHNOLOGIES INC·Filed 2008·Granted Dec 15, 2009·16 cites·33 claims
- 0381US7337076B2Inspection system and apparatusQCEPT TECHNOLOGIES INC·Filed 2006·Granted Feb 26, 2008·6 cites·20 claims
- 0480US7092826B2Semiconductor wafer inspection systemQCEPT TECHNOLOGIES INC·Filed 2005·Granted Aug 15, 2006·6 cites·28 claims
- 0577US7659734B2Semiconductor inspection system and apparatus utilizing a non-vibrating contact potential difference sensor and controlled illuminationQCEPT TECHNOLOGIES INC·Filed 2007·Granted Feb 9, 2010·7 cites·29 claims
- 0674US6957154B2Semiconductor wafer inspection systemQCEPT TECHNOLOGIES INC·Filed 2003·Granted Oct 18, 2005·14 cites·18 claims
- 0773US7752000B2Calibration of non-vibrating contact potential difference measurements to detect surface variations that are perpendicular to the direction of sensor motionQCEPT TECHNOLOGIES INC·Filed 2008·Granted Jul 6, 2010·8 cites·20 claims
- 0873US7379826B2Semiconductor wafer inspection systemQCEPT TECHNOLOGIES INC·Filed 2006·Granted May 27, 2008·3 cites·20 claims
- 0971US7103482B2Inspection system and apparatusQCEPT TECHNOLOGIES INC·Filed 2004·Granted Sep 5, 2006·10 cites·24 claims
- 1066US7308367B2Wafer inspection systemQCEPT TECHNOLOGIES INC·Filed 2004·Granted Dec 11, 2007·7 cites·44 claims
- 1163US7900526B2Defect classification utilizing data from a non-vibrating contact potential difference sensorQCEPT TECHNOLOGIES INC·Filed 2007·Granted Mar 8, 2011·2 cites·21 claims
- 1258US7152476B2Measurement of motions of rotating shafts using non-vibrating contact potential difference sensorQCEPT TECHNOLOGIES INC·Filed 2004·Granted Dec 26, 2006·5 cites·19 claims
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