Assignee
QUESANT INSTR CORP
US·5 granted patents·137 citations·filing 1993–1997
Top patents by PatentIndex Score
5 records- 0184US5388452ADetection system for atomic force microscopesQUESANT INSTR CORP·Filed 1993·Granted Feb 14, 1995·53 cites·26 claims
- 0270US5357105ALight modulated detection system for atomic force microscopesQUESANT INSTR CORP·Filed 1993·Granted Oct 18, 1994·33 cites·11 claims
- 0362US5466935AProgrammable, scanned-probe microscope system and methodQUESANT INSTR CORP·Filed 1995·Granted Nov 14, 1995·28 cites·39 claims
- 0454US5614712AMethod of engaging the scanning probe of a scanning probe microscope with a sample surfaceQUESANT INSTR CORP·Filed 1995·Granted Mar 25, 1997·19 cites·14 claims
- 0533USRE37404EDetection system for atomic force microscopesQUESANT INSTR CORP·Filed 1997·Granted Oct 9, 2001·4 cites·59 claims
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