Assignee
RADWAN MOHAMMED
DE·2 granted patents·1 pending application·2 citations·filing 2011–2012
Top patents by PatentIndex Score
3 records- 0158US8492279B2Method of controlling critical dimensions of vias in a metallization system of a semiconductor device during silicon-ARC etchRADWAN MOHAMMED·Filed 2011·Granted Jul 23, 2013·2 cites·20 claims
- 0238US9018102B2Technique for reducing plasma-induced etch damage during the formation of vias in interlayer dielectrics by modified RF power ramp-upRADWAN MOHAMMED·Filed 2012·Granted Apr 28, 2015·0 cites·10 claims
- 0327US2012028376A1Method of Controlling Critical Dimensions of Trenches in a Metallization System of a Semiconductor Device During Etch of an Etch Stop LayerRADWAN MOHAMMED·Filed 2011·Application pending·0 cites
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →