Assignee
RAINTREE SCIENT INSTRUMENTS (SHANGHAI) CORPORATION
CN·3 granted patents·1 pending application·0 citations·filing 2014–2019
Top patents by PatentIndex Score
4 records- 0144US12033901B2Device and method used for measuring wafersRAINTREE SCIENT INSTRUMENTS SHANGHAI CORPORATION·Filed 2019·Granted Jul 9, 2024·0 cites·22 claims
- 0243US9978152B2Method and system for wafer alignmentRAINTREE SCIENT INSTRUMENTS SHANGHAI CORPORATION·Filed 2014·Granted May 22, 2018·0 cites·8 claims
- 0330US10309834B2Calibrating method and device for broad-band achromatic composite wave plate and corresponding measurement systemRAINTREE SCIENT INSTRUMENTS SHANGHAI CORPORATION·Filed 2016·Granted Jun 4, 2019·0 cites·17 claims
- 0430US2017323761A1Charged particle detectorRAINTREE SCIENT INSTRUMENTS (SHANGHAI) CORPORATION·Filed 2017·Application pending·0 cites
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