Assignee
RAYTEX CORP
US·4 granted patents·1 pending application·30 citations·filing 2003–2007
Top patents by PatentIndex Score
5 records- 0183US6798503B2Edge flaw inspection deviceRAYTEX CORP·Filed 2003·Granted Sep 28, 2004·24 cites·6 claims
- 0271US7616300B2Edge flaw detection deviceRAYTEX CORP·Filed 2005·Granted Nov 10, 2009·6 cites·4 claims
- 0343US7633617B2Defective particle measuring apparatus and defective particle measuring methodRAYTEX CORP·Filed 2006·Granted Dec 15, 2009·0 cites·12 claims
- 0437US2009201495A1Calibration Method For Edge Inspection ApparatusRAYTEX CORP·Filed 2007·Application pending·0 cites
- 0527US7255719B2Wafer rotation device and edge flaw inspection apparataus having the deviceRAYTEX CORP·Filed 2003·Granted Aug 14, 2007·0 cites·7 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →