Assignee
RIGAKU DENKI CO LTD
JP·257 granted patents·57 pending applications·1,845 citations·filing 1975–2025
Top patents by PatentIndex Score
314 records- 0198US11733185B2Fluorescent X-ray analysis apparatus comprising a plurality of X-ray detectors and an X-ray irradiation unit including a multi-wavelength mirrorRIGAKU DENKI CO LTD·Filed 2020·Granted Aug 22, 2023·12 cites·6 claims
- 0296US9020101B2Target for X-ray generator, method of manufacturing the same and X-ray generatorRIGAKU DENKI CO LTD·Filed 2013·Granted Apr 28, 2015·36 cites·12 claims
- 0396US6456691B2X-ray generatorRIGAKU DENKI CO LTD·Filed 2001·Granted Sep 24, 2002·101 cites·14 claims
- 0495US12092593B2Single-crystal X-ray structure analysis apparatus and method, and sample holder unit thereforRIGAKU DENKI CO LTD·Filed 2023·Granted Sep 17, 2024·1 cites·3 claims
- 0595US11525790B2Sample holding device for X-ray analysisRIGAKU DENKI CO LTD·Filed 2020·Granted Dec 13, 2022·4 cites·6 claims
- 0695US10473598B2X-ray thin film inspection deviceRIGAKU DENKI CO LTD·Filed 2014·Granted Nov 12, 2019·33 cites·19 claims
- 0795US10429325B2X-ray small angle optical systemRIGAKU DENKI CO LTD·Filed 2016·Granted Oct 1, 2019·11 cites·10 claims
- 0894US10514345B2X-ray thin film inspection deviceRIGAKU DENKI CO LTD·Filed 2014·Granted Dec 24, 2019·22 cites·10 claims
- 0994US6385289B1X-ray diffraction apparatus and method for measuring X-ray rocking curvesRIGAKU DENKI CO LTD·Filed 2000·Granted May 7, 2002·65 cites·11 claims
- 1093US10514346B2X-ray fluorescence spectrometerRIGAKU DENKI CO LTD·Filed 2017·Granted Dec 24, 2019·20 cites·8 claims
- 1193US10302579B2Grazing incidence x-ray fluorescence spectrometer and grazing incidence x-ray fluorescence analyzing methodRIGAKU DENKI CO LTD·Filed 2017·Granted May 28, 2019·5 cites·7 claims
- 1293US9335282B2X-ray topography apparatusRIGAKU DENKI CO LTD·Filed 2013·Granted May 10, 2016·15 cites·6 claims
- 1393US7130373B2Method and apparatus for film thickness measurementRIGAKU DENKI CO LTD·Filed 2005·Granted Oct 31, 2006·42 cites·7 claims
- 1493US7035373B2X-ray diffraction apparatusRIGAKU DENKI CO LTD·Filed 2004·Granted Apr 25, 2006·45 cites·7 claims
- 1593US6504902B2X-ray optical device and multilayer mirror for small angle scattering systemRIGAKU DENKI CO LTD·Filed 2001·Granted Jan 7, 2003·74 cites·8 claims
- 1692US9746433B2X-ray fluorescence spectrometer and X-ray fluorescence analyzing methodRIGAKU DENKI CO LTD·Filed 2016·Granted Aug 29, 2017·5 cites·7 claims
- 1792US7258485B2X-ray thin film inspection apparatus and thin film inspection apparatus and method for patterned waferRIGAKU DENKI CO LTD·Filed 2005·Granted Aug 21, 2007·47 cites·18 claims
- 1891US12313573B2X-ray diffraction apparatus and measurement methodRIGAKU DENKI CO LTD·Filed 2023·Granted May 27, 2025·2 cites·12 claims
- 1991US11802844B2Single-crystal x-ray structure analysis apparatus and method, and sample holder unit thereforRIGAKU DENKI CO LTD·Filed 2019·Granted Oct 31, 2023·3 cites·3 claims
- 2091US10161888B2Crystalline phase identification method, crystalline phase identification device, and X-ray diffraction measurement systemRIGAKU DENKI CO LTD·Filed 2017·Granted Dec 25, 2018·6 cites·12 claims
- 2191US10082475B2X-ray fluorescence spectrometerRIGAKU DENKI CO LTD·Filed 2016·Granted Sep 25, 2018·5 cites·4 claims
- 2291US7801272B2X-ray diffraction apparatus and X-ray diffraction methodRIGAKU DENKI CO LTD·Filed 2008·Granted Sep 21, 2010·24 cites·13 claims
- 2391US7352846B2Filament for X-ray tube and X-ray tube having the sameRIGAKU DENKI CO LTD·Filed 2006·Granted Apr 1, 2008·16 cites·11 claims
- 2490US9778214B2X-ray analyzing apparatusRIGAKU DENKI CO LTD·Filed 2017·Granted Oct 3, 2017·8 cites·4 claims
- 2590US9658174B2X-ray topography apparatusRIGAKU DENKI CO LTD·Filed 2014·Granted May 23, 2017·10 cites·6 claims
- 2689US11852597B2Degree-of-crystallinity measurement apparatus, degree-of-crystallinity measurement method, and information storage mediumRIGAKU DENKI CO LTD·Filed 2022·Granted Dec 26, 2023·1 cites·8 claims
- 2789US11782000B2Quantitative analysis method, quantitative analysis program, and X-ray fluorescence spectrometerRIGAKU DENKI CO LTD·Filed 2020·Granted Oct 10, 2023·3 cites·8 claims
- 2889US10948436B2Wavelength dispersive X-ray fluorescence spectrometerRIGAKU DENKI CO LTD·Filed 2019·Granted Mar 16, 2021·3 cites·5 claims
- 2989US10161889B2X-ray fluorescence spectrometerRIGAKU DENKI CO LTD·Filed 2018·Granted Dec 25, 2018·3 cites·5 claims
- 3089US10145808B2Beam generation unit and X-ray small-angle scattering apparatusRIGAKU DENKI CO LTD·Filed 2015·Granted Dec 4, 2018·4 cites·16 claims
- 3189US7646849B2Ultra-small angle x-ray scattering measuring apparatusRIGAKU DENKI CO LTD·Filed 2007·Granted Jan 12, 2010·24 cites·10 claims
- 3289US7257192B2Method and apparatus for X-ray reflectance measurementRIGAKU DENKI CO LTD·Filed 2005·Granted Aug 14, 2007·16 cites·5 claims
- 3389US6807251B2X-ray diffraction apparatusRIGAKU DENKI CO LTD·Filed 2002·Granted Oct 19, 2004·56 cites·7 claims
- 3489US6570390B2Method for measuring surface leakage current of sampleRIGAKU DENKI CO LTD·Filed 2001·Granted May 27, 2003·43 cites·9 claims
- 3588US12031927B2Method and device for analyzing diffraction pattern of mixture, and information storage mediumRIGAKU DENKI CO LTD·Filed 2021·Granted Jul 9, 2024·1 cites·8 claims
- 3688US11874204B2Single-crystal X-ray structure analysis apparatus, and method thereforRIGAKU DENKI CO LTD·Filed 2019·Granted Jan 16, 2024·2 cites·22 claims
- 3788US11079345B2X-ray inspection deviceRIGAKU DENKI CO LTD·Filed 2018·Granted Aug 3, 2021·4 cites·8 claims
- 3888US10768125B2Wavelength dispersive x-ray fluorescence spectrometer and x-ray fluorescence analyzing method using the sameRIGAKU DENKI CO LTD·Filed 2018·Granted Sep 8, 2020·3 cites·7 claims
- 3988US8971483B2X-ray composite apparatusRIGAKU DENKI CO LTD·Filed 2013·Granted Mar 3, 2015·8 cites·9 claims
- 4087US9442084B2Optical axis adjustment method for X-ray analyzer and X-ray analyzerRIGAKU DENKI CO LTD·Filed 2014·Granted Sep 13, 2016·20 cites·10 claims
- 4186US10989678B2X-ray analysis system, x-ray analysis device, and vapor phase decomposition deviceRIGAKU DENKI CO LTD·Filed 2019·Granted Apr 27, 2021·2 cites·7 claims
- 4286US10876978B2X-ray inspecting device, X-ray thin film inspecting method, and method for measuring rocking curveRIGAKU DENKI CO LTD·Filed 2017·Granted Dec 29, 2020·8 cites·10 claims
- 4386US9791393B2X-ray detection signal processing device and X-ray analyzing apparatus using sameRIGAKU DENKI CO LTD·Filed 2015·Granted Oct 17, 2017·5 cites·2 claims
- 4486US9046471B2X-ray measurement apparatusRIGAKU DENKI CO LTD·Filed 2013·Granted Jun 2, 2015·11 cites·19 claims
- 4586US7950672B2Magnetic fluid sealing deviceRIGAKU DENKI CO LTD·Filed 2006·Granted May 31, 2011·14 cites·7 claims
- 4686US6456688B1X-ray spectrometer and apparatus for XAFS measurementsRIGAKU DENKI CO LTD·Filed 2000·Granted Sep 24, 2002·59 cites·7 claims
- 4785US12247935B2X-ray fluorescence spectrometerRIGAKU DENKI CO LTD·Filed 2024·Granted Mar 11, 2025·2 cites·4 claims
- 4885US7206378B2X-ray analysis apparatusRIGAKU DENKI CO LTD·Filed 2005·Granted Apr 17, 2007·15 cites·12 claims
- 4984US12105034B2Single-crystal X-ray structure analysis apparatus, and method thereforRIGAKU DENKI CO LTD·Filed 2023·Granted Oct 1, 2024·0 cites·6 claims
- 5084US11788974B2Control apparatus, system, method, and programRIGAKU DENKI CO LTD·Filed 2020·Granted Oct 17, 2023·1 cites·12 claims
Showing the top 50 of 314 patent records by PatentIndex Score.
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