Assignee
RIGAKU IND CORP
JP·28 granted patents·543 citations·filing 1979–2006
Top patents by PatentIndex Score
28 records- 0193US7187751B2X-ray fluorescence spectrometer and program used thereinRIGAKU IND CORP·Filed 2006·Granted Mar 6, 2007·27 cites·5 claims
- 0286US7356114B2X-ray fluorescence spectrometerRIGAKU IND CORP·Filed 2006·Granted Apr 8, 2008·25 cites·3 claims
- 0382US7450685B2X-ray fluorescence spectrometer and program for use therewithRIGAKU IND CORP·Filed 2006·Granted Nov 11, 2008·11 cites·8 claims
- 0481US5132997AX-ray spectroscopic analyzing apparatusRIGAKU IND CORP·Filed 1991·Granted Jul 21, 1992·59 cites·9 claims
- 0580US6611577B1X-ray fluorescence analysis and apparatus thereforRIGAKU IND CORP·Filed 2002·Granted Aug 26, 2003·25 cites·14 claims
- 0680US6404847B1Continuously scanning X-ray analyzer having improved readiness and accuracyRIGAKU IND CORP·Filed 2000·Granted Jun 11, 2002·27 cites·8 claims
- 0778US6937691B2X-ray fluorescence spectrometric system and a program for use thereinRIGAKU IND CORP·Filed 2002·Granted Aug 30, 2005·23 cites·9 claims
- 0878US6292532B1Fluorescent X-ray analyzer useable as wavelength dispersive type and energy dispersive typeRIGAKU IND CORP·Filed 1999·Granted Sep 18, 2001·57 cites·15 claims
- 0974US6668038B2X-ray fluorescence spectrometerRIGAKU IND CORP·Filed 2001·Granted Dec 23, 2003·18 cites·7 claims
- 1072US6438200B1X-ray fluorescence analyzing apparatusRIGAKU IND CORP·Filed 2000·Granted Aug 20, 2002·10 cites·9 claims
- 1171US6457862B1Analyzer system having sample exchangerRIGAKU IND CORP·Filed 2000·Granted Oct 1, 2002·19 cites·19 claims
- 1270US6700951B2X-ray fluorescence spectrometerRIGAKU IND CORP·Filed 2002·Granted Mar 2, 2004·15 cites·4 claims
- 1370US6028911AX-ray analyzing apparatus with enhanced radiation intensityRIGAKU IND CORP·Filed 1998·Granted Feb 22, 2000·36 cites·7 claims
- 1470US5406609AX-ray analysis apparatusRIGAKU IND CORP·Filed 1993·Granted Apr 11, 1995·40 cites·14 claims
- 1569US5732120AFluorescent X-ray analyzing apparatusRIGAKU IND CORP·Filed 1997·Granted Mar 24, 1998·35 cites·7 claims
- 1667US6836533B2Multi-layer film spectroscopic element for boron fluorescene X-ray analysisRIGAKU IND CORP·Filed 2002·Granted Dec 28, 2004·7 cites·3 claims
- 1767US6735276B2Sample preprocessing system for a fluorescent X-ray analysis and X-ray fluorescence spectrometric system using the sameRIGAKU IND CORP·Filed 2002·Granted May 11, 2004·10 cites·4 claims
- 1863US6647090B2X-ray fluorescence spectrometerRIGAKU IND CORP·Filed 2002·Granted Nov 11, 2003·6 cites·5 claims
- 1960US7016463B2Sample retainer for x-ray fluorescence analysis, x-ray fluorescence analyzing method using the same and x-ray fluorescence spectrometer thereforRIGAKU IND CORP·Filed 2004·Granted Mar 21, 2006·4 cites·5 claims
- 2060US6337897B1Fluorescent X-ray analyzerRIGAKU IND CORP·Filed 1999·Granted Jan 8, 2002·26 cites·16 claims
- 2156US6708121B2Analyzing apparatusRIGAKU IND CORP·Filed 2001·Granted Mar 16, 2004·2 cites·3 claims
- 2254US6824746B2High-energy beam irradiating desulfurization deviceRIGAKU IND CORP·Filed 2002·Granted Nov 30, 2004·11 cites·69 claims
- 2348US4271353AX-ray spectroscopeRIGAKU IND CORP·Filed 1979·Granted Jun 2, 1981·11 cites·9 claims
- 2447US5579362AMethod of and apparatus for the quantitative measurement of paint coatingRIGAKU IND CORP·Filed 1995·Granted Nov 26, 1996·14 cites·11 claims
- 2542US4256961AX-ray spectroscopeRIGAKU IND CORP·Filed 1979·Granted Mar 17, 1981·7 cites·10 claims
- 2628US6240159B1Fluorescent X-ray analyzer with path switching deviceRIGAKU IND CORP·Filed 1999·Granted May 29, 2001·6 cites·10 claims
- 2726US4788700AFluorescent X-ray analyzing method of solution specimen and specimen sampler used for the methodRIGAKU IND CORP·Filed 1986·Granted Nov 29, 1988·5 cites·19 claims
- 2823US5103470ACharacteristic x-ray detecting deviceRIGAKU IND CORP·Filed 1990·Granted Apr 7, 1992·7 cites·20 claims
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