Assignee
SATO HIDETOSHI
JP·5 granted patents·14 citations·filing 2007–2012
Top patents by PatentIndex Score
5 records- 0175US8295584B2Pattern measurement methods and pattern measurement equipmentSATO HIDETOSHI·Filed 2009·Granted Oct 23, 2012·11 cites·2 claims
- 0269US9044929B2Printing apparatusSATO HIDETOSHI·Filed 2012·Granted Jun 2, 2015·2 cites·10 claims
- 0363US8199191B2Electron microscope for inspecting dimension and shape of a pattern formed on a waferSATO HIDETOSHI·Filed 2007·Granted Jun 12, 2012·1 cites·6 claims
- 0451US9874645B2POS system, bar code scanner, and method for controlling POS systemSATO HIDETOSHI·Filed 2011·Granted Jan 23, 2018·0 cites·3 claims
- 0544US9381735B2Printing deviceSATO HIDETOSHI·Filed 2011·Granted Jul 5, 2016·0 cites·11 claims
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →