Assignee
SAWA NOBUHIRO
JP·1 granted patent·1 pending application·0 citations·filing 2010–2011
Technology mixG01R2
Top patents by PatentIndex Score
2 records- 0123US8410803B2Test apparatus of semiconductor device and method thereofSAWA NOBUHIRO·Filed 2010·Granted Apr 2, 2013·0 cites·8 claims
- 0216US2012043983A1Inspection device of semiconductor integrated circuit, inspection method of semiconductor integrated circuit, and control program of inspection device of semiconductor integrated circuitSAWA NOBUHIRO·Filed 2011·Application pending·0 cites
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