Assignee
SCATTER WORKS INC
US·2 granted patents·1 pending application·64 citations·filing 1999–2004
Top patents by PatentIndex Score
3 records- 0177US6091493AProcess for particle size measurementSCATTER WORKS INC·Filed 1999·Granted Jul 18, 2000·53 cites·34 claims
- 0268US6833028B1Particle deposition system with enhanced speed and diameter accuracySCATTER WORKS INC·Filed 2002·Granted Dec 21, 2004·11 cites·15 claims
- 0341US2005118332A1Particle deposition system with enhanced speed and diameter accuracySCATTER WORKS INC·Filed 2004·Application pending·0 cites
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →