Assignee
SCHULTZ J ALBERT
US·5 granted patents·1 pending application·107 citations·filing 1990–2011
Top patents by PatentIndex Score
6 records- 0194US5087815AHigh resolution mass spectrometry of recoiled ions for isotopic and trace elemental analysisSCHULTZ J ALBERT·Filed 1990·Granted Feb 11, 1992·95 cites·47 claims
- 0288US8614416B2Nonoparticulate assisted nanoscale molecular imaging by mass spectrometerySCHULTZ J ALBERT·Filed 2011·Granted Dec 24, 2013·5 cites·29 claims
- 0376US8129675B2Neutral/ion reactor in adiabatic supersonic gas flow for ion mobility time-of-flight mass spectrometrySCHULTZ J ALBERT·Filed 2009·Granted Mar 6, 2012·5 cites·21 claims
- 0472US8829428B2Time-of-flight spectrometry and spectroscopy of surfacesSCHULTZ J ALBERT·Filed 2010·Granted Sep 9, 2014·2 cites·37 claims
- 0555US2009072133A1Multi-beam ion mobility time-of-flight mass spectrometer with bipolar ion extraction and zwitterion detectionSCHULTZ J ALBERT·Filed 2008·Application pending·0 cites
- 0654US8519329B2Time-of-flight mass spectrometry of surfacesSCHULTZ J ALBERT·Filed 2011·Granted Aug 27, 2013·0 cites·16 claims
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