Assignee
SCHULZE MARK A
US·1 granted patent·1 pending application·1 citations·filing 2004–2010
Top patents by PatentIndex Score
2 records- 0155US8275564B2Patterned wafer inspection system using a non-vibrating contact potential difference sensorSCHULZE MARK A·Filed 2010·Granted Sep 25, 2012·1 cites·16 claims
- 0233US2006103892A1System and method for a vector difference mean filter for noise suppressionSCHULZE MARK A·Filed 2004·Application pending·0 cites
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