Assignee

SCI INSTR INC

US·2 granted patents·75 citations·filing 2002–2004

Technology mixG01B1 G01J1 G01N1

Top patents by PatentIndex Score

2 records

0186US7505133B1Optical metrology systems and methodsSCI INSTR INC·Filed 2004·Granted Mar 17, 2009·36 cites·13 claims
0286US6717669B2Self-calibrating spectrometers and auto-calibration methodsSCI INSTR INC·Filed 2002·Granted Apr 6, 2004·39 cites·18 claims

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