Assignee
SCIOCS CO LTD
JP·29 granted patents·6 pending applications·12 citations·filing 2015–2022
Top patents by PatentIndex Score
35 records- 0190US11339053B2Nitride crystalSCIOCS CO LTD·Filed 2019·Granted May 24, 2022·2 cites·12 claims
- 0287US10978296B2Nitride semiconductor substrate, semiconductor laminate, laminated structure, method for manufacturing nitride semiconductor substrate and method for manufacturing semiconductor laminateSCIOCS CO LTD·Filed 2018·Granted Apr 13, 2021·4 cites·9 claims
- 0382US11342220B2Structure manufacturing method and manufacturing device, and light irradiation deviceSCIOCS CO LTD·Filed 2019·Granted May 24, 2022·2 cites·19 claims
- 0473US11380765B2Structure and intermediate structureSCIOCS CO LTD·Filed 2019·Granted Jul 5, 2022·1 cites·7 claims
- 0571US11289322B2Structure manufacturing method including surface photoelectrochemical etching and structure manufacturing deviceSCIOCS CO LTD·Filed 2019·Granted Mar 29, 2022·2 cites·12 claims
- 0671US10290489B2Method for manufacturing group-III nitride substrate and group-III nitride substrateSCIOCS CO LTD·Filed 2017·Granted May 14, 2019·1 cites·19 claims
- 0767US11107971B2Laminated substrate with piezoelectric thin film, piezoelectric thin film element and method for manufacturing this elementSCIOCS CO LTD·Filed 2016·Granted Aug 31, 2021·0 cites·6 claims
- 0864US11008671B2Nitride crystalSCIOCS CO LTD·Filed 2019·Granted May 18, 2021·0 cites·3 claims
- 0959US11377756B2Nitride crystal substrate and method for manufacturing the sameSCIOCS CO LTD·Filed 2019·Granted Jul 5, 2022·0 cites·3 claims
- 1055US10665683B2GaN material and method of manufacturing semiconductor deviceSCIOCS CO LTD·Filed 2019·Granted May 26, 2020·0 cites·13 claims
- 1155US2023099777A1Production apparatus for producing structural body and production method for producing structural bodySCIOCS CO LTD·Filed 2022·Application pending·0 cites
- 1253US10903074B2GaN laminate and method of manufacturing the sameSCIOCS CO LTD·Filed 2019·Granted Jan 26, 2021·0 cites·9 claims
- 1352US10381230B2Gallium nitride substrate and optical device using the sameSCIOCS CO LTD·Filed 2016·Granted Aug 13, 2019·0 cites·4 claims
- 1451US11339500B2Nitride crystal substrate, semiconductor laminate, method of manufacturing semiconductor laminate and method of manufacturing semiconductor deviceSCIOCS CO LTD·Filed 2018·Granted May 24, 2022·0 cites·21 claims
- 1551US10978294B2Semi-insulating crystal, N-type semiconductor crystal and P-type semiconductor crystalSCIOCS CO LTD·Filed 2017·Granted Apr 13, 2021·0 cites·7 claims
- 1650US11393693B2Structure manufacturing method and intermediate structureSCIOCS CO LTD·Filed 2020·Granted Jul 19, 2022·0 cites·23 claims
- 1750US10707309B2GaN laminate and method of manufacturing the sameSCIOCS CO LTD·Filed 2019·Granted Jul 7, 2020·0 cites·10 claims
- 1850US10483388B2Nitride semiconductor epitaxial substrate and semiconductor deviceSCIOCS CO LTD·Filed 2018·Granted Nov 19, 2019·0 cites·6 claims
- 1947US10584031B2Nitride crystal substrateSCIOCS CO LTD·Filed 2017·Granted Mar 10, 2020·0 cites·8 claims
- 2047US10325793B2Method for producing crystal substrateSCIOCS CO LTD·Filed 2017·Granted Jun 18, 2019·0 cites·15 claims
- 2147US2022384614A1Semiconductor device and method for manufacturing structureSCIOCS CO LTD·Filed 2020·Application pending·0 cites
- 2246US11094539B2Method for manufacturing nitride semiconductor substrate and nitride semiconductor substrateSCIOCS CO LTD·Filed 2018·Granted Aug 17, 2021·0 cites·9 claims
- 2346US2022285525A1Method for manufacturing structure, and structureSCIOCS CO LTD·Filed 2020·Application pending·0 cites
- 2445US11508629B2Nitride semiconductor laminate, method for manufacturing nitride semiconductor laminate, method for manufacturing semiconductor laminate, and method for inspecting semiconductor laminateSCIOCS CO LTD·Filed 2017·Granted Nov 22, 2022·0 cites·14 claims
- 2545US10364510B2Substrate for crystal growth having a plurality of group III nitride seed crystals arranged in a disc shapeSCIOCS CO LTD·Filed 2016·Granted Jul 30, 2019·0 cites·12 claims
- 2644US11473907B2Method for manufacturing semiconductor structure, inspection method, and semiconductor structureSCIOCS CO LTD·Filed 2018·Granted Oct 18, 2022·0 cites·7 claims
- 2743US11342191B2Structure manufacturing method, structure manufacturing apparatus and intermediate structureSCIOCS CO LTD·Filed 2020·Granted May 24, 2022·0 cites·17 claims
- 2843US2021210602A1Semiconductor wafer for heterojunction bipolar transistor and heterojunction bipolar transistorSCIOCS CO LTD·Filed 2019·Application pending·0 cites
- 2942US10683587B2Method for manufacturing nitride crystal substrate and nitride crystal laminateSCIOCS CO LTD·Filed 2017·Granted Jun 16, 2020·0 cites·6 claims
- 3042US2021005717A1Group-iii nitride laminateSCIOCS CO LTD·Filed 2020·Application pending·0 cites
- 3140US10770554B2Nitride semiconductor substrate, semiconductor device, and method for manufacturing nitride semiconductor substrateSCIOCS CO LTD·Filed 2017·Granted Sep 8, 2020·0 cites·12 claims
- 3240US2020388546A1Method of measuring film thickness, method of manufacturing nitride semiconductor laminate and nitride semiconductor laminateSCIOCS CO LTD·Filed 2018·Application pending·0 cites
- 3339US11075077B2Nitride semiconductor template and nitride semiconductor deviceSCIOCS CO LTD·Filed 2017·Granted Jul 27, 2021·0 cites·5 claims
- 3437US10818757B2Nitride semiconductor substrate, semiconductor device, and method for manufacturing nitride semiconductor substrateSCIOCS CO LTD·Filed 2017·Granted Oct 27, 2020·0 cites·12 claims
- 3536US10538858B2Method for manufacturing group 13 nitride crystal and group 13 nitride crystalSCIOCS CO LTD·Filed 2015·Granted Jan 21, 2020·0 cites·8 claims
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