Assignee
SEMICONDUCTOR COMPONENTS IND
US·740 granted patents·56 pending applications·9,680 citations·filing 1994–2020
Top patents by PatentIndex Score
796 records- 0198US9373732B2Image sensors with reflective optical cavity pixelsSEMICONDUCTOR COMPONENTS IND·Filed 2013·Granted Jun 21, 2016·55 cites·18 claims
- 0298US8012857B2Semiconductor die singulation methodSEMICONDUCTOR COMPONENTS IND·Filed 2010·Granted Sep 6, 2011·58 cites·15 claims
- 0398US7989319B2Semiconductor die singulation methodSEMICONDUCTOR COMPONENTS IND·Filed 2010·Granted Aug 2, 2011·60 cites·20 claims
- 0498US7985661B2Semiconductor die singulation methodSEMICONDUCTOR COMPONENTS IND·Filed 2010·Granted Jul 26, 2011·51 cites·19 claims
- 0598US7781310B2Semiconductor die singulation methodSEMICONDUCTOR COMPONENTS IND·Filed 2007·Granted Aug 24, 2010·55 cites·13 claims
- 0698US7253477B2Semiconductor device edge termination structureSEMICONDUCTOR COMPONENTS IND·Filed 2005·Granted Aug 7, 2007·118 cites·23 claims
- 0798US7176524B2Semiconductor device having deep trench charge compensation regions and methodSEMICONDUCTOR COMPONENTS IND·Filed 2005·Granted Feb 13, 2007·91 cites·20 claims
- 0897US9391135B1Semiconductor deviceSEMICONDUCTOR COMPONENTS IND·Filed 2015·Granted Jul 12, 2016·20 cites·14 claims
- 0997US8384231B2Method of forming a semiconductor dieSEMICONDUCTOR COMPONENTS IND·Filed 2010·Granted Feb 26, 2013·33 cites·16 claims
- 1097US7411266B2Semiconductor device having trench charge compensation regions and methodSEMICONDUCTOR COMPONENTS IND·Filed 2006·Granted Aug 12, 2008·61 cites·20 claims
- 1196US9344649B2Floating point image sensors with different integration timesSEMICONDUCTOR COMPONENTS IND·Filed 2014·Granted May 17, 2016·32 cites·20 claims
- 1296US9343497B2Imagers with stacked integrated circuit diesSEMICONDUCTOR COMPONENTS IND·Filed 2013·Granted May 17, 2016·40 cites·18 claims
- 1396US9337098B1Semiconductor die back layer separation methodSEMICONDUCTOR COMPONENTS IND·Filed 2015·Granted May 10, 2016·22 cites·24 claims
- 1496US9202833B2Imaging systems with baffle gridsSEMICONDUCTOR COMPONENTS IND·Filed 2014·Granted Dec 1, 2015·23 cites·19 claims
- 1596US9118883B2High dynamic range imaging with multi-storage pixelsSEMICONDUCTOR COMPONENTS IND·Filed 2012·Granted Aug 25, 2015·27 cites·16 claims
- 1696US7579632B2Multi-channel ESD device and method thereforSEMICONDUCTOR COMPONENTS IND·Filed 2007·Granted Aug 25, 2009·62 cites·20 claims
- 1796US7528551B2LED control systemSEMICONDUCTOR COMPONENTS IND·Filed 2007·Granted May 5, 2009·55 cites·15 claims
- 1896US7482220B2Semiconductor device having deep trench charge compensation regions and methodSEMICONDUCTOR COMPONENTS IND·Filed 2006·Granted Jan 27, 2009·37 cites·11 claims
- 1996US7319266B2Encapsulated electronic device structureSEMICONDUCTOR COMPONENTS IND·Filed 2005·Granted Jan 15, 2008·36 cites·6 claims
- 2096US7285823B2Superjunction semiconductor device structureSEMICONDUCTOR COMPONENTS IND·Filed 2005·Granted Oct 23, 2007·57 cites·18 claims
- 2196US7276747B2Semiconductor device having screening electrode and methodSEMICONDUCTOR COMPONENTS IND·Filed 2005·Granted Oct 2, 2007·46 cites·16 claims
- 2296US7256119B2Semiconductor device having trench structures and methodSEMICONDUCTOR COMPONENTS IND·Filed 2005·Granted Aug 14, 2007·38 cites·20 claims
- 2396US6756771B1Power factor correction method with zero crossing detection and adjustable stored reference voltageSEMICONDUCTOR COMPONENTS IND·Filed 2003·Granted Jun 29, 2004·80 cites·20 claims
- 2496US6300679B1Flexible substrate for packaging a semiconductor componentSEMICONDUCTOR COMPONENTS IND·Filed 1998·Granted Oct 9, 2001·239 cites·30 claims
- 2595US9270906B2Exposure time selection using stacked-chip image sensorsSEMICONDUCTOR COMPONENTS IND·Filed 2013·Granted Feb 23, 2016·41 cites·14 claims
- 2695US9247170B2Triple conversion gain image sensor pixelsSEMICONDUCTOR COMPONENTS IND·Filed 2013·Granted Jan 26, 2016·32 cites·16 claims
- 2795US7868379B2Electronic device including a trench and a conductive structure thereinSEMICONDUCTOR COMPONENTS IND·Filed 2008·Granted Jan 11, 2011·28 cites·22 claims
- 2895US6204097B1Semiconductor device and method of manufactureSEMICONDUCTOR COMPONENTS IND·Filed 1999·Granted Mar 20, 2001·182 cites·24 claims
- 2994US9350914B1Methods of enforcing privacy requests in imaging systemsSEMICONDUCTOR COMPONENTS IND·Filed 2015·Granted May 24, 2016·32 cites·21 claims
- 3094US9245333B1Systems and methods for detecting obstructions within the field-of-view of an image sensorSEMICONDUCTOR COMPONENTS IND·Filed 2014·Granted Jan 26, 2016·42 cites·16 claims
- 3194US9230306B2System for reducing depth of field with digital image processingSEMICONDUCTOR COMPONENTS IND·Filed 2013·Granted Jan 5, 2016·22 cites·17 claims
- 3294US9182490B2Video and 3D time-of-flight image sensorsSEMICONDUCTOR COMPONENTS IND·Filed 2013·Granted Nov 10, 2015·32 cites·17 claims
- 3394US9136173B2Singulation method for semiconductor die having a layer of material along one major surfaceSEMICONDUCTOR COMPONENTS IND·Filed 2013·Granted Sep 15, 2015·12 cites·31 claims
- 3494US7679146B2Semiconductor device having sub-surface trench charge compensation regionsSEMICONDUCTOR COMPONENTS IND·Filed 2006·Granted Mar 16, 2010·28 cites·19 claims
- 3594US7525333B1Current sense circuitSEMICONDUCTOR COMPONENTS IND·Filed 2006·Granted Apr 28, 2009·32 cites·19 claims
- 3694US6469484B2Power supply circuit and method thereof to detect demagnitization of the power supplySEMICONDUCTOR COMPONENTS IND·Filed 2001·Granted Oct 22, 2002·122 cites·14 claims
- 3793US9363450B2Imaging systems and methods for image signal gain adjustmentSEMICONDUCTOR COMPONENTS IND·Filed 2014·Granted Jun 7, 2016·18 cites·10 claims
- 3893US9349770B2Imaging systems with infrared pixels having increased quantum efficiencySEMICONDUCTOR COMPONENTS IND·Filed 2014·Granted May 24, 2016·9 cites·19 claims
- 3993US7538395B2Method of forming low capacitance ESD device and structure thereforSEMICONDUCTOR COMPONENTS IND·Filed 2007·Granted May 26, 2009·31 cites·7 claims
- 4093US7483270B2Fan speed control systemSEMICONDUCTOR COMPONENTS IND·Filed 2002·Granted Jan 27, 2009·70 cites·42 claims
- 4193US6084268APower MOSFET device having low on-resistance and methodSEMICONDUCTOR COMPONENTS IND·Filed 1997·Granted Jul 4, 2000·139 cites·14 claims
- 4292US9277147B2Multimode pixel readout for enhanced dynamic rangeSEMICONDUCTOR COMPONENTS IND·Filed 2014·Granted Mar 1, 2016·12 cites·20 claims
- 4392US9269779B2Insulated gate semiconductor device having a shield electrode structureSEMICONDUCTOR COMPONENTS IND·Filed 2014·Granted Feb 23, 2016·13 cites·20 claims
- 4492US9257513B1Semiconductor component and methodSEMICONDUCTOR COMPONENTS IND·Filed 2014·Granted Feb 9, 2016·12 cites·18 claims
- 4592US9245952B2Method of forming a semiconductor device and structure thereforSEMICONDUCTOR COMPONENTS IND·Filed 2014·Granted Jan 26, 2016·13 cites·14 claims
- 4692US7981757B2Semiconductor component and method of manufactureSEMICONDUCTOR COMPONENTS IND·Filed 2010·Granted Jul 19, 2011·11 cites·11 claims
- 4792US7808752B2Integrated passive filter incorporating inductors and ESD protectorsSEMICONDUCTOR COMPONENTS IND·Filed 2005·Granted Oct 5, 2010·37 cites·23 claims
- 4892US7602027B2Semiconductor component and method of manufactureSEMICONDUCTOR COMPONENTS IND·Filed 2006·Granted Oct 13, 2009·21 cites·4 claims
- 4992US7521909B2Linear regulator and method thereforSEMICONDUCTOR COMPONENTS IND·Filed 2006·Granted Apr 21, 2009·36 cites·17 claims
- 5092US7297603B2Bi-directional transistor and method thereforSEMICONDUCTOR COMPONENTS IND·Filed 2005·Granted Nov 20, 2007·42 cites·13 claims
Showing the top 50 of 796 patent records by PatentIndex Score.
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