Assignee

SEMICONDUCTOR PHYSICS LAB CO LTD

HU·1 granted patent·3 citations·filing 2012–2012

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0170US8912799B2Accurate measurement of excess carrier lifetime using carrier decay methodSEMICONDUCTOR PHYSICS LAB CO LTD·Filed 2012·Granted Dec 16, 2014·3 cites·14 claims

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