Assignee
SEMICONDUCTOR TECH & INSTR INC
US·19 granted patents·446 citations·filing 1994–2001
Top patents by PatentIndex Score
19 records- 0192US6118540AMethod and apparatus for inspecting a workpieceSEMICONDUCTOR TECH & INSTR INC·Filed 1997·Granted Sep 12, 2000·99 cites·17 claims
- 0286US6207946B1Adaptive lighting system and method for machine vision apparatusSEMICONDUCTOR TECH & INSTR INC·Filed 1999·Granted Mar 27, 2001·109 cites·28 claims
- 0381US5956134AInspection system and method for leads of semiconductor devicesSEMICONDUCTOR TECH & INSTR INC·Filed 1998·Granted Sep 21, 1999·68 cites·30 claims
- 0472US6765666B1System and method for inspecting bumped wafersSEMICONDUCTOR TECH & INSTR INC·Filed 2000·Granted Jul 20, 2004·18 cites·18 claims
- 0570US6252981B1System and method for selection of a reference dieSEMICONDUCTOR TECH & INSTR INC·Filed 1999·Granted Jun 26, 2001·41 cites·26 claims
- 0666US6459807B1System and method for locating irregular edges in image dataSEMICONDUCTOR TECH & INSTR INC·Filed 2000·Granted Oct 1, 2002·12 cites·20 claims
- 0763US6532063B13-D lead inspectionSEMICONDUCTOR TECH & INSTR INC·Filed 2000·Granted Mar 11, 2003·10 cites·14 claims
- 0861US6178861B1Single station cutting apparatus for separating semiconductor packagesSEMICONDUCTOR TECH & INSTR INC·Filed 2000·Granted Jan 30, 2001·9 cites·22 claims
- 0958US6396578B2Post-seal inspection system and methodSEMICONDUCTOR TECH & INSTR INC·Filed 2001·Granted May 28, 2002·4 cites·20 claims
- 1055US6445518B1Three dimensional lead inspection systemSEMICONDUCTOR TECH & INSTR INC·Filed 2000·Granted Sep 3, 2002·10 cites·14 claims
- 1146US5745593AMethod and system for inspecting integrated circuit lead burrsSEMICONDUCTOR TECH & INSTR INC·Filed 1996·Granted Apr 28, 1998·16 cites·22 claims
- 1242US6173632B1Single station cutting apparatus for separating semiconductor packagesSEMICONDUCTOR TECH & INSTR INC·Filed 1998·Granted Jan 16, 2001·11 cites·16 claims
- 1341US6128034AHigh speed lead inspection systemSEMICONDUCTOR TECH & INSTR INC·Filed 1994·Granted Oct 3, 2000·10 cites·17 claims
- 1438US5777886AProgrammable lead conditionerSEMICONDUCTOR TECH & INSTR INC·Filed 1994·Granted Jul 7, 1998·10 cites·22 claims
- 1535US5838434ASemiconductor device lead calibration unitSEMICONDUCTOR TECH & INSTR INC·Filed 1996·Granted Nov 17, 1998·11 cites·11 claims
- 1628US5826630AJ-lead conditioning method and apparatusSEMICONDUCTOR TECH & INSTR INC·Filed 1997·Granted Oct 27, 1998·4 cites·12 claims
- 1726US6259522B1Post-seal inspection system and methodSEMICONDUCTOR TECH & INSTR INC·Filed 1999·Granted Jul 10, 2001·2 cites·13 claims
- 1825US6654658B2System and method for conditioning leadsSEMICONDUCTOR TECH & INSTR INC·Filed 2000·Granted Nov 25, 2003·0 cites·20 claims
- 1915US6151864ASystem and method for transferring components between packing mediaSEMICONDUCTOR TECH & INSTR INC·Filed 1999·Granted Nov 28, 2000·2 cites·17 claims
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