Assignee
SEMIGHT INSTR CO LTD
CN·8 granted patents·3 pending applications·0 citations·filing 2024–2025
Top patents by PatentIndex Score
11 records- 0174US2025334645A1Method, device, and storage medium for battery physical self-discharge detectionSEMIGHT INSTR CO LTD·Filed 2025·Application pending·0 cites
- 0268US12235316B2Chip moving deviceSEMIGHT INSTR CO LTD·Filed 2024·Granted Feb 25, 2025·0 cites·19 claims
- 0366US12546815B2Chip testing device and package testing machineSEMIGHT INSTR CO LTD·Filed 2024·Granted Feb 10, 2026·0 cites·18 claims
- 0462US12237184B1Heating structure and wafer test deviceSEMIGHT INSTR CO LTD·Filed 2024·Granted Feb 25, 2025·0 cites·10 claims
- 0557US12216156B2Chip test pressing-down apparatus and formation method thereofSEMIGHT INSTR CO LTD·Filed 2024·Granted Feb 4, 2025·0 cites·7 claims
- 0655US12216139B2Adaptive flexible chip test socket and formation method thereofSEMIGHT INSTR CO LTD·Filed 2024·Granted Feb 4, 2025·0 cites·10 claims
- 0753US12487251B2Adaptive chip testing apparatus and formation method thereofSEMIGHT INSTR CO LTD·Filed 2024·Granted Dec 2, 2025·0 cites·20 claims
- 0853US12228603B2Wafer-level semiconductor high-voltage reliability test fixtureSEMIGHT INSTR CO LTD·Filed 2024·Granted Feb 18, 2025·0 cites·9 claims
- 0953US2024335958A1Automatic chip pick-and-place apparatus and formation method thereofSEMIGHT INSTR CO LTD·Filed 2024·Application pending·0 cites
- 1050US2024310433A1Probe mounting structure and reliability test system for wafer-level reliability testSEMIGHT INSTR CO LTD·Filed 2024·Application pending·0 cites
- 1148US12448226B2Die inspection sorting system with limiting groove formed on surface of limiting blockSEMIGHT INSTR CO LTD·Filed 2024·Granted Oct 21, 2025·0 cites·8 claims
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