Assignee
SEMISYSCO CO LTD
KR·1 granted patent·2 pending applications·0 citations·filing 2007–2015
Top patents by PatentIndex Score
3 records- 0130US8351051B2System and method of measuring irregularity of a glass substrateSEMISYSCO CO LTD·Filed 2011·Granted Jan 8, 2013·0 cites·18 claims
- 0222US2015195274A1System and method of certificating a genuine articleSEMISYSCO CO LTD·Filed 2015·Application pending·0 cites
- 0318US2009229348A1Real time leak detection system of process chamberSEMISYSCO CO LTD·Filed 2007·Application pending·0 cites
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