Assignee
SEMITEST INC
US·8 granted patents·588 citations·filing 1988–1998
Top patents by PatentIndex Score
8 records- 0195US5091691AApparatus for making surface photovoltage measurements of a semiconductorSEMITEST INC·Filed 1988·Granted Feb 25, 1992·132 cites·19 claims
- 0294US4891584AApparatus for making surface photovoltage measurements of a semiconductorSEMITEST INC·Filed 1988·Granted Jan 2, 1990·218 cites·37 claims
- 0390US4827212ANoninvasive method and apparatus for characterization of semiconductorsSEMITEST INC·Filed 1988·Granted May 2, 1989·63 cites·9 claims
- 0475US5453703AMethod for determining the minority carrier surface recombination lifetime constant (ts of a specimen of semiconductor materialSEMITEST INC·Filed 1993·Granted Sep 26, 1995·41 cites·9 claims
- 0574US6097205AMethod and apparatus for characterizing a specimen of semiconductor materialSEMITEST INC·Filed 1997·Granted Aug 1, 2000·51 cites·33 claims
- 0674US5087876AApparatus and method for making surface photovoltage measurements of a semiconductorSEMITEST INC·Filed 1990·Granted Feb 11, 1992·42 cites·14 claims
- 0756US6163163ASemiconductor material characterizing method and apparatusSEMITEST INC·Filed 1998·Granted Dec 19, 2000·23 cites·8 claims
- 0852US6034535AMethod utilizing a modulated light beam for determining characteristics such as the doping concentration profile of a specimen of semiconductor materialSEMITEST INC·Filed 1997·Granted Mar 7, 2000·18 cites·10 claims
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