Assignee

SEMITEX CO LTD

JP·3 granted patents·79 citations·filing 1990–1991

Technology mixG01R3

Top patents by PatentIndex Score

3 records

0168US5047713AMethod and apparatus for measuring a deep impurity level of a semiconductor crystalSEMITEX CO LTD·Filed 1990·Granted Sep 10, 1991·35 cites·10 claims
0262US5081414AMethod for measuring lifetime of semiconductor material and apparatus thereforSEMITEX CO LTD·Filed 1990·Granted Jan 14, 1992·26 cites·17 claims
0348US5138255AMethod and apparatus for measuring lifetime of semiconductor material including waveguide tuning meansSEMITEX CO LTD·Filed 1991·Granted Aug 11, 1992·18 cites·6 claims

Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →