Assignee
SEMITRONIX CORP
CN·12 granted patents·2 pending applications·5 citations·filing 2013–2023
Top patents by PatentIndex Score
14 records- 0177US9646900B2Programmable addressable test chipSEMITRONIX CORP·Filed 2015·Granted May 9, 2017·3 cites·18 claims
- 0270US10725101B2Addressable test chip with multiple-stage transmission gatesSEMITRONIX CORP·Filed 2019·Granted Jul 28, 2020·1 cites·20 claims
- 0367US11156505B2Temperature sensorSEMITRONIX CORP·Filed 2019·Granted Oct 26, 2021·1 cites·20 claims
- 0462US11668748B2Addressable test chipSEMITRONIX CORP·Filed 2022·Granted Jun 6, 2023·0 cites·14 claims
- 0559US10254339B2Addressable test chip test systemSEMITRONIX CORP·Filed 2017·Granted Apr 9, 2019·0 cites·19 claims
- 0658US11959964B2Addressable test chip test systemSEMITRONIX CORP·Filed 2023·Granted Apr 16, 2024·0 cites·20 claims
- 0755US11243251B2Addressable test system with address registerSEMITRONIX CORP·Filed 2020·Granted Feb 8, 2022·0 cites·16 claims
- 0855US10725102B2Addressable test chip with sensing circuitSEMITRONIX CORP·Filed 2019·Granted Jul 28, 2020·0 cites·20 claims
- 0944US10156605B2Addressable ring oscillator test chipSEMITRONIX CORP·Filed 2015·Granted Dec 18, 2018·0 cites·18 claims
- 1044US9146270B2Method for testing a plurality of transistors in a target chipSEMITRONIX CORP·Filed 2014·Granted Sep 29, 2015·0 cites·8 claims
- 1141US11274971B2Temperature sensorSEMITRONIX CORP·Filed 2019·Granted Mar 15, 2022·0 cites·19 claims
- 1241US2014115547A1Method of Generating Parameterized UnitsSEMITRONIX CORP·Filed 2013·Application pending·0 cites
- 1341US2015042372A1Addressable test circuit and test method for key parameters of transistorsSEMITRONIX CORP·Filed 2014·Application pending·0 cites
- 1436US9817058B2Addressable test circuit and test method for key parameters of transistorsSEMITRONIX CORP·Filed 2016·Granted Nov 14, 2017·0 cites·19 claims
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